Patrick J. McGinnis

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for single die backside probing of semiconduct...
- Patent number 7,112,983
- Issue date Sep 26, 2006
- International Business Machines Corporation
- Patrick J. McGinnis
- G01 - MEASURING TESTING
Information Patent Grant
Laser-induced critical parameter analysis of CMOS devices
- Patent number 7,038,474
- Issue date May 2, 2006
- International Business Machines Corporation
- Patrick J. McGinnis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR INTEGRATED CIRCUIT COOLING DURING TESTING AND IMAGE B...
- Publication number 20080272474
- Publication date Nov 6, 2008
- International Business Machines Corporation
- Patrick J. McGinnis
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INTEGRATED CIRCUIT COOLING DURING TESTING...
- Publication number 20070164426
- Publication date Jul 19, 2007
- International Business Machines Corporation
- Patrick J. McGinnis
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SINGLE DIE BACKSIDE PROBING OF SEMICONDUCT...
- Publication number 20060097742
- Publication date May 11, 2006
- Patrick J. McGinnis
- G01 - MEASURING TESTING
Information Patent Application
LASER-INDUCED CRITICAL PARAMETER ANALYSIS OF CMOS DEVICES
- Publication number 20060066325
- Publication date Mar 30, 2006
- International Business Machines Corporation
- Patrick J. McGinnis
- G01 - MEASURING TESTING