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Patrick J. Peoples
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Intervale, NH, US
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last 30 patents
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Patent Grant
Linear flaw detector
Patent number
4,184,082
Issue date
Jan 15, 1980
Howell Laboratories, Incorporated
Patrick J. Peoples
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for measuring the brightness of pulp slurry
Patent number
4,040,743
Issue date
Aug 9, 1977
Howell Laboratories, Incorporated
Henry F. Villaume
G01 - MEASURING TESTING