Patrick L. SMITH

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Vancouver, WA, US

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Patents Applicationslast 30 patents

Information Patent Application
ADVANCED IN-SITU PARTICLE DETECTION SYSTEM FOR SEMICONDUCTOR SUBSTR...
- Publication number 20180156727
- Publication date Jun 7, 2018
- Applied Materials, Inc.
- Lin ZHANG
- G01 - MEASURING TESTING
Information Patent Application
CHAMBER LEAK AND GAS CONTAIMINATION DETECTION
- Publication number 20170107610
- Publication date Apr 20, 2017
- Shuo Julia NA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...