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Patrick Louis Ponsardin
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Placitas, NM, US
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Patents Grants
last 30 patents
Information
Patent Grant
Virtual scene generator and probability of interception system and...
Patent number
8,374,832
Issue date
Feb 12, 2013
Exelis Inc.
Christopher S. Kletecka
G01 - MEASURING TESTING
Information
Patent Grant
Method, apparatus and system for rapid and sensitive standoff detec...
Patent number
7,796,251
Issue date
Sep 14, 2010
ITT Manufacturing Enterprises, Inc.
Patrick Louis Ponsardin
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for geo-referencing and visualization of detected...
Patent number
7,383,129
Issue date
Jun 3, 2008
ITT Manufacturing Enterprises, Inc.
Yohan Baillot
G01 - MEASURING TESTING
Information
Patent Grant
Raman interrogation of threat aerosols
Patent number
7,333,190
Issue date
Feb 19, 2008
ITT Manufacturing Enterprises, Inc.
James E. Pendell-Jones
G01 - MEASURING TESTING
Information
Patent Grant
Laser interrogation of surface agents
Patent number
6,788,407
Issue date
Sep 7, 2004
ITT Manufacturing Enterprises, Inc.
Noah Scott Higdon
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Method, Apparatus and System for Rapid and Sensitive Standoff Detec...
Publication number
20070222981
Publication date
Sep 27, 2007
ITT Manufacturing Enterprises, Inc.
Patrick Louis Ponsardin
G01 - MEASURING TESTING