Patrick M. Cowan

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Pflugerville, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Fault detection and control methodologies for ion implantation proc...
- Patent number 6,960,774
- Issue date Nov 1, 2005
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process control based on an estimated process result
- Patent number 6,925,347
- Issue date Aug 2, 2005
- Advanced Micro Devices, Inc.
- Michael L. Miller
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Determination of a process flow based upon fault detection analysis
- Patent number 6,740,534
- Issue date May 25, 2004
- Advanced Micro Devices, Inc.
- Ernest D. Adams
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for monitoring tool health
- Patent number 6,594,589
- Issue date Jul 15, 2003
- Advanced Micro Devices, Inc.
- Elfido Coss
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Fault detection and control methodologies for ion implantation proc...
- Publication number 20050092939
- Publication date May 5, 2005
- Elfido Coss
- H01 - BASIC ELECTRIC ELEMENTS