Patrick M. MAXTON

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Laser-based cleaning device for film analysis tool
- Patent number 7,253,901
- Issue date Aug 7, 2007
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Laser-based cleaning device for film analysis tool
- Patent number 7,202,951
- Issue date Apr 10, 2007
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for preparing a sample for thin film analysis
- Patent number 7,190,441
- Issue date Mar 13, 2007
- KLA-Tencor Technologies Corp.
- James T. McWhirter
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing surface characteristics with self-calibrating...
- Patent number 6,804,003
- Issue date Oct 12, 2004
- KLA-Tencor Corporation
- Haiming Wang
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing surface characteristics with self-calibrating...
- Patent number 6,734,968
- Issue date May 11, 2004
- Haiming Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONCENTRATING PHOTOVOLTAIC PHOTO-CURRENT BALANCING SYSTEM
- Publication number 20100126555
- Publication date May 27, 2010
- Hoozad Inc.
- Patrick M. MAXTON
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Measurement of thin film properties using plasmons
- Publication number 20050057754
- Publication date Mar 17, 2005
- David E. A. Smith
- G01 - MEASURING TESTING
Information Patent Application
Laser-based cleaning device for film analysis tool
- Publication number 20030137662
- Publication date Jul 24, 2003
- Gary R. Janik
- G01 - MEASURING TESTING