Patrick McNally

Person

Dublin, IE

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for remote sensing a plasma
- Patent number 11,476,098
- Issue date Oct 18, 2022
- Dublin City University
- Patrick J. McNally
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optoacoustic inspection device for inspection of semiconductor wafers
- Patent number 10,031,109
- Issue date Jul 24, 2018
- Dublin City University
- Chanel Moira Pia Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analysis of semiconductor materials using...
- Patent number 7,586,611
- Issue date Sep 8, 2009
- Dublin City University
- Donnacha Lowney
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-INVASIVE MEASUREMENT OF PLASMA SYSTEMS
- Publication number 20230335382
- Publication date Oct 19, 2023
- Dublin City University
- Patrick McNally
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR REMOTE SENSING A PLASMA
- Publication number 20230230821
- Publication date Jul 20, 2023
- Dublin City University
- Patrick J. McNally
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR REMOTE SENSING A PLASMA
- Publication number 20210104387
- Publication date Apr 8, 2021
- Dublin City University
- Patrick J. McNally
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTOACOUSTIC METROLOGY TOOL
- Publication number 20150204822
- Publication date Jul 23, 2015
- Sonex Metrology Ltd.
- Kenneth Horan
- G01 - MEASURING TESTING
Information Patent Application
OPTOACOUSTIC INSPECTION DEVICE FOR INSPECTION OF SEMICONDUCTOR WAFERS
- Publication number 20130247658
- Publication date Sep 26, 2013
- Dublin City University
- Chanel Moira Pia Hayden
- G01 - MEASURING TESTING
Information Patent Application
Electroluminescent device for the production of ultra-violet light
- Publication number 20110204483
- Publication date Aug 25, 2011
- Patrick McNally
- C30 - CRYSTAL GROWTH
Information Patent Application
SYSTEM FOR ANALYSING PLASMA
- Publication number 20110056272
- Publication date Mar 10, 2011
- Dublin City University
- Patrick McNally
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for analysis of semiconductor materials using...
- Publication number 20060256339
- Publication date Nov 16, 2006
- Donnacha Lowney
- G01 - MEASURING TESTING

Patrick McNally

Person

Patents Grantslast 30 patents

System and method for remote sensing a plasma

Optoacoustic inspection device for inspection of semiconductor wafers

Method and apparatus for analysis of semiconductor materials using...

Patents Applicationslast 30 patents

NON-INVASIVE MEASUREMENT OF PLASMA SYSTEMS

SYSTEM AND METHOD FOR REMOTE SENSING A PLASMA

SYSTEM AND METHOD FOR REMOTE SENSING A PLASMA

PHOTOACOUSTIC METROLOGY TOOL

OPTOACOUSTIC INSPECTION DEVICE FOR INSPECTION OF SEMICONDUCTOR WAFERS

Electroluminescent device for the production of ultra-violet light

SYSTEM FOR ANALYSING PLASMA

Method and apparatus for analysis of semiconductor materials using...