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Patrick N. Everett
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Concord, MA, US
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last 30 patents
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Patent Grant
Method and system for interference lithography utilizing phase-lock...
Patent number
6,882,477
Issue date
Apr 19, 2005
Massachusetts Institute of Technology
Mark Schattenburg
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical gap measuring apparatus and method having two-dimensional g...
Patent number
6,522,411
Issue date
Feb 18, 2003
Massachusetts Institute of Technology
Euclid E. Moon
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical interference alignment and gapping apparatus
Patent number
6,088,103
Issue date
Jul 11, 2000
Massachusetts Institute of Technology
Patrick N. Everett
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical alignment apparatus having multiple parallel alignment marks
Patent number
5,808,742
Issue date
Sep 15, 1998
Massachusetts Institute of Technology
Patrick N. Everett
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Measurements using balanced illumination optical microscopy
Patent number
5,260,558
Issue date
Nov 9, 1993
Massachusetts Institute of Technology
William C. Goltsos
G01 - MEASURING TESTING
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Patent Grant
Device and method for the alignment of masks
Patent number
5,160,959
Issue date
Nov 3, 1992
Massachusetts Institute of Technology
Patrick N. Everett
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY