Patrick Paul Camus

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Pen Argyl, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Devices and systems for improved collection efficiency and resoluti...
- Patent number 11,035,806
- Issue date Jun 15, 2021
- EDAX, Incorporated
- Patrick Paul Camus
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for in situ high temperature X-ray spectroscopy...
- Patent number 10,656,106
- Issue date May 19, 2020
- EDAX, Incorporated
- Patrick Paul Camus
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for high energy X-ray detection in electron mic...
- Patent number 10,614,997
- Issue date Apr 7, 2020
- EDAX, Incorporated
- Patrick Paul Camus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and systems for spatial averaging of electron backscatter d...
- Patent number 9,791,390
- Issue date Oct 17, 2017
- EDAX, Incorporated
- Stuart Ian Wright
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICES AND SYSTEMS FOR IMPROVED COLLECTION EFFICIENCY AND RESOLUTI...
- Publication number 20200200691
- Publication date Jun 25, 2020
- EDAX, Incorporated
- Patrick Paul Camus
- G02 - OPTICS
Information Patent Application
SYSTEMS AND METHODS FOR IN SITU HIGH TEMPERATURE X-RAY SPECTROSCOPY...
- Publication number 20190242836
- Publication date Aug 8, 2019
- EDAX, Incorporated
- Patrick Paul Camus
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR HIGH ENERGY X-RAY DETECTION IN ELECTRON MIC...
- Publication number 20190043689
- Publication date Feb 7, 2019
- EDAX, Incorporated
- Patrick Paul Camus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES AND SYSTEMS FOR SPATIAL AVERAGING OF ELECTRON BACKSCATTER D...
- Publication number 20160216219
- Publication date Jul 28, 2016
- EDAX, Incorporated
- Stuart Ian Wright
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Material Texture Analysis
- Publication number 20150109431
- Publication date Apr 23, 2015
- EDAX, MATERIALS ANALYSIS DIVISION OF AMETEK INC.
- Stuart I. Wright
- G01 - MEASURING TESTING