Patrick R. Crosby

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Test pattern compression
- Patent number 8,214,170
- Issue date Jul 3, 2012
- International Business Machines Corporation
- Patrick R. Crosby
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain fail diagnostics
- Patent number 8,006,152
- Issue date Aug 23, 2011
- International Business Machines Corporation
- Samuel I. Ward
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCAN CHAIN FAIL DIAGNOSTICS
- Publication number 20100180168
- Publication date Jul 15, 2010
- International Business Machines Corporation
- Samuel I. Ward
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN COMPRESSION
- Publication number 20100179784
- Publication date Jul 15, 2010
- International Business Machines Corporation
- Patrick R. Crosby
- G01 - MEASURING TESTING