Patrick R. Justison

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Parallel test structure
- Patent number 10,475,677
- Issue date Nov 12, 2019
- GLOBALFOUNDRIES Inc.
- Tian Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnect structure for semiconductor devices with multiple powe...
- Patent number 9,812,396
- Issue date Nov 7, 2017
- GLOBALFOUNDRIES Inc.
- Jason Eugene Stephens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitors positioned at the device level in an integrated circuit...
- Patent number 9,275,989
- Issue date Mar 1, 2016
- GLOBALFOUNDRIES Inc.
- Kok Yong Yiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitors positioned at the device level in an integrated circuit...
- Patent number 8,975,133
- Issue date Mar 10, 2015
- GLOBALFOUNDRIES Inc.
- Kok Yong Yiang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PARALLEL TEST STRUCTURE
- Publication number 20190067056
- Publication date Feb 28, 2019
- GLOBALFOUNDRIES INC.
- Tian Shen
- G01 - MEASURING TESTING
Information Patent Application
CAPACITORS POSITIONED AT THE DEVICE LEVEL IN AN INTEGRATED CIRCUIT...
- Publication number 20150123181
- Publication date May 7, 2015
- GLOBALFOUNDRIES INC.
- Kok Yong Yiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITORS POSITIONED AT THE DEVICE LEVEL IN AN INTEGRATED CIRCUIT...
- Publication number 20140042510
- Publication date Feb 13, 2014
- GLOBALFOUNDRIES INC.
- Kok Yong Yiang
- H01 - BASIC ELECTRIC ELEMENTS