Patrick S. Spinney

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Charlotte, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor test structure and method for forming the same
- Patent number 10,699,973
- Issue date Jun 30, 2020
- GLOBALFOUNDERS INC.
- Anthony K. Stamper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip with anti-reverse engineering function
- Patent number 10,141,274
- Issue date Nov 27, 2018
- International Business Machines Corporation
- Edward C. Cooney
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test structure for monitoring interface delamination
- Patent number 10,056,306
- Issue date Aug 21, 2018
- GLOBALFOUNDRIES Inc.
- Edward C. Cooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip with anti-reverse engineering function
- Patent number 9,893,023
- Issue date Feb 13, 2018
- International Business Machines Corporation
- Edward C. Cooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip with anti-reverse engineering function
- Patent number 9,711,464
- Issue date Jul 18, 2017
- International Business Machines Corporation
- Edward C. Cooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wiring bond pad structures
- Patent number 9,553,061
- Issue date Jan 24, 2017
- GLOBALFOUNDRIES Inc.
- Donald R. Letourneau
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST STRUCTURE AND METHOD FOR FORMING THE SAME
- Publication number 20190139841
- Publication date May 9, 2019
- GLOBALFOUNDRIES INC.
- Anthony K. Stamper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR CHIP WITH ANTI-REVERSE ENGINEERING FUNCTION
- Publication number 20180053734
- Publication date Feb 22, 2018
- International Business Machines Corporation
- Edward C. Cooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR CHIP WITH ANTI-REVERSE ENGINEERING FUNCTION
- Publication number 20170263574
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Edward C. Cooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCUTRE FOR MONITORING INTERFACE DELAMINATION
- Publication number 20170229358
- Publication date Aug 10, 2017
- GLOBALFOUNDRIES INC.
- Edward C. Cooney
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CHIP WITH ANTI-REVERSE ENGINEERING FUNCTION
- Publication number 20170084552
- Publication date Mar 23, 2017
- International Business Machines Corporation
- Edward C. Cooney
- H01 - BASIC ELECTRIC ELEMENTS