Patrick Scheer

Person

  • Saint Martin D'Heres, FR

Patents Grantslast 30 patents

  • Information Patent Grant

    Transistor test structure

    • Patent number 9,000,785
    • Issue date Apr 7, 2015
    • STMicroelectronics S.A.
    • Clement Charbuillet
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    FDSOI-TYPE FIELD-EFFECT TRANSISTORS

    • Publication number 20180097014
    • Publication date Apr 5, 2018
    • STMicroelectronics (Crolles 2) SAS
    • Vincent Barral
    • B82 - NANO-TECHNOLOGY
  • Information Patent Application

    TRANSISTOR TEST STRUCTURE

    • Publication number 20130027066
    • Publication date Jan 31, 2013
    • STMicroelectronics S.A.
    • Clement Charbuillet
    • G01 - MEASURING TESTING