Patrick Scott Hunter

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Seattle, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Sensor subsystems for non-contact voltage measurement devices
- Patent number 10,605,832
- Issue date Mar 31, 2020
- Fluke Corporation
- David L. Epperson
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact electrical parameter measurement systems
- Patent number 10,352,967
- Issue date Jul 16, 2019
- Fluke Corporation
- Ronald Steuer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT SYSTEMS
- Publication number 20180136257
- Publication date May 17, 2018
- FLUKE CORPORATION
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Application
SENSOR SUBSYSTEMS FOR NON-CONTACT VOLTAGE MEASUREMENT DEVICES
- Publication number 20180136259
- Publication date May 17, 2018
- FLUKE CORPORATION
- David L. Epperson
- G01 - MEASURING TESTING