Patrick Simpkins

Person

Edina, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer holding mechanism
- Patent number 8,130,372
- Issue date Mar 6, 2012
- Rudolph Technologies, Inc.
- Mark Harless
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Product setup sharing for multiple inspection systems
- Patent number 8,045,788
- Issue date Oct 25, 2011
- August Technology Corp.
- Cory Watkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer holding mechanism
- Patent number 7,703,823
- Issue date Apr 27, 2010
- Rudolph Technologies, Inc.
- Mark Harless
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoresist edge bead removal measurement
- Patent number 7,684,611
- Issue date Mar 23, 2010
- Rudolph Technologies, Inc.
- Patrick Simpkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Camera and illumination matching for inspection system
- Patent number 7,589,783
- Issue date Sep 15, 2009
- Rudolph Technologies, Inc.
- Patrick Simpkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dynamic focusing method and apparatus
- Patent number 7,321,108
- Issue date Jan 22, 2008
- Rudolph Technology, Inc.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic focusing method and apparatus
- Patent number 7,196,300
- Issue date Mar 27, 2007
- Rudolph Technologies, Inc.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Photoresist edge bead removal measurement
- Patent number 7,197,178
- Issue date Mar 27, 2007
- Rudolph Technologies, Inc.
- Patrick Simpkins
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER HOLDING MECHANISM
- Publication number 20100166292
- Publication date Jul 1, 2010
- Mark Harless
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTORESIST EDGE BEAD REMOVAL MEASUREMENT
- Publication number 20080002877
- Publication date Jan 3, 2008
- Patrick Simpkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC FOCUSING METHOD AND APPARTUS
- Publication number 20070114358
- Publication date May 24, 2007
- Cory Watkins
- G02 - OPTICS
Information Patent Application
Wafer holding mechanism
- Publication number 20060046396
- Publication date Mar 2, 2006
- Mark Harless
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic focusing method and apparatus
- Publication number 20060033056
- Publication date Feb 16, 2006
- Cory Watkins
- G02 - OPTICS
Information Patent Application
Camera module for an optical inspection system and related method o...
- Publication number 20060023229
- Publication date Feb 2, 2006
- Cory Watkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Camera and illumination matching for inspection system
- Publication number 20050052530
- Publication date Mar 10, 2005
- Patrick Simpkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Product setup sharing for multiple inspection systems
- Publication number 20050041850
- Publication date Feb 24, 2005
- Cory Watkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Photoresist edge bead removal measurement
- Publication number 20050013476
- Publication date Jan 20, 2005
- August Technology Corp.
- Patrick Simpkins
- G06 - COMPUTING CALCULATING COUNTING

Patrick Simpkins

Person

Patents Grantslast 30 patents

Wafer holding mechanism

Product setup sharing for multiple inspection systems

Wafer holding mechanism

Photoresist edge bead removal measurement

Camera and illumination matching for inspection system

Dynamic focusing method and apparatus

Dynamic focusing method and apparatus

Photoresist edge bead removal measurement

Patents Applicationslast 30 patents

WAFER HOLDING MECHANISM

PHOTORESIST EDGE BEAD REMOVAL MEASUREMENT

DYNAMIC FOCUSING METHOD AND APPARTUS

Wafer holding mechanism

Dynamic focusing method and apparatus

Camera module for an optical inspection system and related method o...

Camera and illumination matching for inspection system

Product setup sharing for multiple inspection systems

Photoresist edge bead removal measurement