Patrick Wiegand

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Pinckney, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods for collection, dark correction, and reporting of spectra f...
- Patent number 10,260,942
- Issue date Apr 16, 2019
- Kaiser Optical Systems Inc.
- Patrick Wiegand
- G01 - MEASURING TESTING
Information Patent Grant
Methods for collection, dark correction, and reporting of spectra f...
- Patent number 10,048,128
- Issue date Aug 14, 2018
- Kaiser Optical Systems Inc.
- Patrick Wiegand
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR COLLECTION, DARK CORRECTION, AND REPORTING OF SPECTRA F...
- Publication number 20180328785
- Publication date Nov 15, 2018
- KAISER OPTICAL SYSTEMS INC.
- Patrick Wiegand
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR COLLECTION, DARK CORRECTION, AND REPORTING OF SPECTRA F...
- Publication number 20170241837
- Publication date Aug 24, 2017
- Kaiser Optical Systems, Inc.
- Patrick Wiegand
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR COLLECTION, DARK CORRECTION, AND REPORTING OF SPECTRA F...
- Publication number 20160356647
- Publication date Dec 8, 2016
- KAISER OPTICAL SYSTEMS INC.
- Patrick Wiegand
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR COLLECTION, DARK CORRECTION, AND REPORTING OF SPECTRA F...
- Publication number 20160356646
- Publication date Dec 8, 2016
- KAISER OPTICAL SYSTEMS INC.
- Patrick Wiegand
- G01 - MEASURING TESTING
Information Patent Application
OUTPUT SIGNAL-TO-NOISE WITH MINIMAL LAG EFFECTS USING INPUT-SPECIFI...
- Publication number 20150339262
- Publication date Nov 26, 2015
- KAISER OPTICAL SYSTEMS INC.
- Patrick Wiegand
- G01 - MEASURING TESTING