Patrick Y. Huet

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Decision tree construction for automatic classification of defects...
- Patent number 9,489,599
- Issue date Nov 8, 2016
- KLA-Tencor Corp.
- Chien-Huei (Adam) Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-implemented methods for performing one or more defect-rela...
- Patent number 9,037,280
- Issue date May 19, 2015
- KLA-Tencor Technologies Corp.
- Mark Dishner
- G05 - CONTROLLING REGULATING
Information Patent Grant
Monitoring of time-varying defect classification performance
- Patent number 8,537,349
- Issue date Sep 17, 2013
- KLA-Tencor Corporation
- Patrick Huet
- G05 - CONTROLLING REGULATING
Information Patent Grant
Process excursion detection
- Patent number 8,289,510
- Issue date Oct 16, 2012
- KLA-Tencor Corporation
- Patrick Y. Huet
- G01 - MEASURING TESTING
Information Patent Grant
Multi-scale classification of defects
- Patent number 8,165,837
- Issue date Apr 24, 2012
- KLA-Tencor Corporation
- Saravanan Paramasivam
- G01 - MEASURING TESTING
Information Patent Grant
Process excursion detection
- Patent number 7,646,476
- Issue date Jan 12, 2010
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for generating an inspection process for an ins...
- Patent number 7,570,797
- Issue date Aug 4, 2009
- KLA-Tencor Technologies Corp.
- David Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection systems and methods for analyzing inspection data
- Patent number 7,417,724
- Issue date Aug 26, 2008
- KLA-Tencor Technologies Corp.
- Paul Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Process excursion detection
- Patent number 7,394,534
- Issue date Jul 1, 2008
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection systems and methods for analyzing inspection data
- Patent number 7,227,628
- Issue date Jun 5, 2007
- KLA-Tencor Technologies Corp.
- Paul Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Flexible hybrid defect classification for semiconductor manufacturing
- Patent number 7,142,992
- Issue date Nov 28, 2006
- KLA-Tencor Technologies Corp.
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of spatially repeating signatures
- Patent number 7,006,886
- Issue date Feb 28, 2006
- KLA-Tencor Technologies Corporation
- Patrick Y. Huet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spatial signature analysis
- Patent number 6,718,526
- Issue date Apr 6, 2004
- KLA-Tencor Corporation
- Peter Eldredge
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Decision Tree Construction for Automatic Classification of Defects...
- Publication number 20150125064
- Publication date May 7, 2015
- KLA-Tencor Corporation
- Chien-Huei (Adam) Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING OF TIME-VARYING DEFECT CLASSIFICATION PERFORMANCE
- Publication number 20110224932
- Publication date Sep 15, 2011
- KLA-Tencor Corporation
- Patrick Huet
- G05 - CONTROLLING REGULATING
Information Patent Application
Process Excursion Detection
- Publication number 20110137576
- Publication date Jun 9, 2011
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process Excursion Detection
- Publication number 20100067781
- Publication date Mar 18, 2010
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process Excursion Detection
- Publication number 20080204739
- Publication date Aug 28, 2008
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer-implemented methods for performing one or more defect-rela...
- Publication number 20060287751
- Publication date Dec 21, 2006
- Mark Dishner
- G05 - CONTROLLING REGULATING
Information Patent Application
FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20060265145
- Publication date Nov 23, 2006
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING

Patrick Y. Huet

Person

Patents Grantslast 30 patents

Decision tree construction for automatic classification of defects...

Computer-implemented methods for performing one or more defect-rela...

Monitoring of time-varying defect classification performance

Process excursion detection

Multi-scale classification of defects

Process excursion detection

Methods and systems for generating an inspection process for an ins...

Wafer inspection systems and methods for analyzing inspection data

Process excursion detection

Wafer inspection systems and methods for analyzing inspection data

Flexible hybrid defect classification for semiconductor manufacturing

Detection of spatially repeating signatures

Spatial signature analysis

Patents Applicationslast 30 patents

Decision Tree Construction for Automatic Classification of Defects...

MONITORING OF TIME-VARYING DEFECT CLASSIFICATION PERFORMANCE

Process Excursion Detection

Process Excursion Detection

Process Excursion Detection

Computer-implemented methods for performing one or more defect-rela...

FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING