Paul A. Bogucki

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Test flow to detect a latent leaky bit of a non-volatile memory
- Patent number 8,995,202
- Issue date Mar 31, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Fuchen Mu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEST FLOW TO DETECT A LATENT LEAKY BIT OF A NON-VOLATILE MEMORY
- Publication number 20130308402
- Publication date Nov 21, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Fuchen Mu
- G11 - INFORMATION STORAGE