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Paul A. Ferno
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Dripping Springs, TX, US
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last 30 patents
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Patent Grant
Method and apparatus for identifying outliers following burn-in tes...
Patent number
8,010,310
Issue date
Aug 30, 2011
Advanced Micro Devices, Inc.
Rajesh Vijayaraghavan
G01 - MEASURING TESTING
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Patent Application
METHOD AND APPARATUS FOR IDENTIFYING OUTLIERS FOLLOWING BURN-IN TES...
Publication number
20090027077
Publication date
Jan 29, 2009
Rajesh Vijayaraghavan
G01 - MEASURING TESTING