Paul Arleo

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Menlo Park, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Process condition measuring device (PCMD) and method for measuring...
- Patent number 9,134,186
- Issue date Sep 15, 2015
- KLA-Tencor Corporation
- Mei Sun
- G01 - MEASURING TESTING
Information Patent Grant
ELECTROSTATIC OR MECHANICAL CHUCK ASSEMBLY CONFERRING IMPROVED TEMP...
- Patent number 6,373,679
- Issue date Apr 16, 2002
- Cypress Semiconductor Corp.
- Jianmin Qiao
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Oxide etch process with high selectivity to nitride suitable for us...
- Patent number 6,184,150
- Issue date Feb 6, 2001
- Applied Materials Inc.
- Chan-Lon Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oxide etch process using a mixture of a fluorine-substituted hydroc...
- Patent number 5,880,037
- Issue date Mar 9, 1999
- Applied Materials, Inc.
- Paul Arleo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for forming a via in an integrated circuit structure by etc...
- Patent number 5,176,790
- Issue date Jan 5, 1993
- Applied Materials, Inc.
- Paul Arleo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROCESS CONDITION MEASURING DEVICE (PCMD) AND METHOD FOR MEASURING...
- Publication number 20120203495
- Publication date Aug 9, 2012
- KLA-Tencor Corporation
- Mei Sun
- G01 - MEASURING TESTING