Paul C. Goodley

Person

Healdsburg, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Atmospheric pressure ionization apparatus and method
- Patent number 8,502,162
- Issue date Aug 6, 2013
- Agilent Technologies, Inc.
- Harvey D. Loucks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for surface desorption ionization by charged p...
- Patent number 8,129,677
- Issue date Mar 6, 2012
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion calibrant introduction
- Patent number 7,855,357
- Issue date Dec 21, 2010
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatuses, methods and compositions for ionization of samples and...
- Patent number 7,737,395
- Issue date Jun 15, 2010
- Agilent Technologies, Inc.
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for surface desorption ionization by charged p...
- Patent number 7,723,678
- Issue date May 25, 2010
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid chromatography chip with flexible interface
- Patent number 7,462,280
- Issue date Dec 9, 2008
- Agilent Technologies, Inc.
- Paul C. Goodley
- G01 - MEASURING TESTING
Information Patent Grant
Curved conduit ion sampling device and method
- Patent number 7,423,261
- Issue date Sep 9, 2008
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanospray ionization device and method
- Patent number 7,385,189
- Issue date Jun 10, 2008
- Agilent Technologies, Inc.
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro matrix ion generator for analyzers
- Patent number 7,205,536
- Issue date Apr 17, 2007
- Agilent Technologies, Inc.
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrospray ion source for mass spectroscopy
- Patent number 7,204,431
- Issue date Apr 17, 2007
- Agilent Technologies, Inc.
- Ganggiang Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro matrix ion generator for analyzers
- Patent number 7,115,860
- Issue date Oct 3, 2006
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro matrix ion generator for analyzers
- Patent number 6,967,324
- Issue date Nov 22, 2005
- Agilent Technologies, Inc.
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,797,946
- Issue date Sep 28, 2004
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,639,216
- Issue date Oct 28, 2003
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Micro matrix ion generator for analyzers
- Patent number 6,627,880
- Issue date Sep 30, 2003
- Agilent Technologies, Inc.
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,498,343
- Issue date Dec 24, 2002
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,294,779
- Issue date Sep 25, 2001
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,278,110
- Issue date Aug 21, 2001
- Hewlett-Packard Company
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for electrospray .[.LC/MS.]. mass spectrometry
- Patent number RE36892
- Issue date Oct 3, 2000
- Agilent Technologies
- James A. Apffel
- 250 - Radiant energy
Information Patent Grant
Micro concentric tube nebulizer for coupling liquid devices to chem...
- Patent number 5,752,663
- Issue date May 19, 1998
- Hewlett-Packard Company
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 5,750,988
- Issue date May 12, 1998
- Hewlett-Packard Company
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Self generating ion device for mass spectrometry of liquids
- Patent number 5,559,326
- Issue date Sep 24, 1996
- Hewlett-Packard Company
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multimode ionization source
- Patent number 4,960,991
- Issue date Oct 2, 1990
- Hewlett-Packard Company
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-axis electron acceleration electrode for liquid chromatography/m...
- Patent number 4,851,700
- Issue date Jul 25, 1989
- Paul C. Goodley
- G01 - MEASURING TESTING
Information Patent Grant
Micro-nebulizer for analytical instruments
- Patent number 4,746,068
- Issue date May 24, 1988
- Hewlett-Packard Company
- Paul C. Goodley
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ATMOSPHERIC PRESSURE IONIZATION APPARATUS AND METHOD
- Publication number 20120318973
- Publication date Dec 20, 2012
- AGILENT TECHNOLOGIES, INC.
- Harvey D. Loucks, JR.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Surface Desorption Ionization by Charged P...
- Publication number 20100230589
- Publication date Sep 16, 2010
- AGILENT TECHNOLOGIES, INC.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUSES, METHODS AND COMPOSITIONS FOR IONIZATION OF SAMPLES AND...
- Publication number 20080067336
- Publication date Mar 20, 2008
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization of neutral gas-phase molecules and mass calibrants
- Publication number 20080067356
- Publication date Mar 20, 2008
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiple Capture Device And Method
- Publication number 20080048111
- Publication date Feb 28, 2008
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Curved conduit ion sampling device and method
- Publication number 20070235642
- Publication date Oct 11, 2007
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for surface desorption ionization by charged p...
- Publication number 20070228271
- Publication date Oct 4, 2007
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analytical system and method
- Publication number 20070221839
- Publication date Sep 27, 2007
- Paul C. Goodley
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Apparatus and method for ion calibrant introduction
- Publication number 20070164231
- Publication date Jul 19, 2007
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nanospray ionization device and method
- Publication number 20070023676
- Publication date Feb 1, 2007
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid chromatography chip with flexible interface
- Publication number 20070017869
- Publication date Jan 25, 2007
- Paul C. Goodley
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for ion capture and production
- Publication number 20070001114
- Publication date Jan 4, 2007
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nanospray ion source with multiple spray emitters
- Publication number 20060208186
- Publication date Sep 21, 2006
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Micro matrix ion generator for analyzers
- Publication number 20050139765
- Publication date Jun 30, 2005
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Micro matrix ion generator for analyzers
- Publication number 20050139766
- Publication date Jun 30, 2005
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrospray ion source for mass spectroscopy
- Publication number 20050092855
- Publication date May 5, 2005
- Ganggiang Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for surface activation and selective ion gener...
- Publication number 20040217277
- Publication date Nov 4, 2004
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Orthogonal ion sampling for apci mass spectrometry
- Publication number 20040046118
- Publication date Mar 11, 2004
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Application
Micro matrix ion generator for analyzers
- Publication number 20040036019
- Publication date Feb 26, 2004
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Micro matrix ion generator for analyzers
- Publication number 20030102437
- Publication date Jun 5, 2003
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Orthogonal ion sampling for APCI mass spectrometry
- Publication number 20030075680
- Publication date Apr 24, 2003
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Application
Orthogonal ion sampling for APCI mass spectrometry
- Publication number 20010042829
- Publication date Nov 22, 2001
- James A. Apffel
- G01 - MEASURING TESTING

Paul C. Goodley

Person

Patents Grantslast 30 patents

Atmospheric pressure ionization apparatus and method

Method and apparatus for surface desorption ionization by charged p...

Apparatus and method for ion calibrant introduction

Apparatuses, methods and compositions for ionization of samples and...

Method and apparatus for surface desorption ionization by charged p...

Liquid chromatography chip with flexible interface

Curved conduit ion sampling device and method

Nanospray ionization device and method

Micro matrix ion generator for analyzers

Electrospray ion source for mass spectroscopy

Micro matrix ion generator for analyzers

Micro matrix ion generator for analyzers

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Micro matrix ion generator for analyzers

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for electrospray .[.LC/MS.]. mass spectrometry

Micro concentric tube nebulizer for coupling liquid devices to chem...

Orthogonal ion sampling for APCI mass spectrometry

Self generating ion device for mass spectrometry of liquids

Multimode ionization source

On-axis electron acceleration electrode for liquid chromatography/m...

Micro-nebulizer for analytical instruments

Patents Applicationslast 30 patents

ATMOSPHERIC PRESSURE IONIZATION APPARATUS AND METHOD

Method and Apparatus for Surface Desorption Ionization by Charged P...

APPARATUSES, METHODS AND COMPOSITIONS FOR IONIZATION OF SAMPLES AND...

Ionization of neutral gas-phase molecules and mass calibrants

Multiple Capture Device And Method

Curved conduit ion sampling device and method

Method and apparatus for surface desorption ionization by charged p...

Analytical system and method

Apparatus and method for ion calibrant introduction

Nanospray ionization device and method

Liquid chromatography chip with flexible interface

Apparatus and method for ion capture and production

Nanospray ion source with multiple spray emitters

Micro matrix ion generator for analyzers

Micro matrix ion generator for analyzers

Electrospray ion source for mass spectroscopy

Apparatus and method for surface activation and selective ion gener...

Orthogonal ion sampling for apci mass spectrometry

Micro matrix ion generator for analyzers

Micro matrix ion generator for analyzers

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry