Paul Cornelis Hubertus Aben

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection method and apparatus and lithographic processing cell
- Patent number RE49460
- Issue date Mar 14, 2023
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
Information Patent Grant
Inspection method and apparatus and lithographic processing cell
- Patent number RE49199
- Issue date Sep 6, 2022
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
Information Patent Grant
Methods and apparatus for calculating substrate model parameters an...
- Patent number 11,300,891
- Issue date Apr 12, 2022
- ASML Netherlands B.V.
- Jasper Menger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for calculating substrate model parameters an...
- Patent number 10,859,930
- Issue date Dec 8, 2020
- ASML Netherlands B.V.
- Jasper Menger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for calculating substrate model parameters an...
- Patent number 10,495,990
- Issue date Dec 3, 2019
- ASML Netherlands B.V.
- Jasper Menger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for transferring a mark pattern to a substrate, a calibratio...
- Patent number 10,191,390
- Issue date Jan 29, 2019
- ASML Netherlands B.V.
- Paul Cornelis Hubertus Aben
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus and lithographic processing cell
- Patent number 8,887,107
- Issue date Nov 11, 2014
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR CALCULATING SUBSTRATE MODEL PARAMETERS AN...
- Publication number 20210191286
- Publication date Jun 24, 2021
- ASML NETHERLANDS B.V.
- Jasper MENGER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND APPARATUS FOR CALCULATING SUBSTRATE MODEL PARAMETERS AN...
- Publication number 20200057395
- Publication date Feb 20, 2020
- ASML NETHERLANDS B.V.
- Jasper MENGER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR TRANSFERRING A MARK PATTERN TO A SUBSTRATE, A CALIBRATIO...
- Publication number 20180149981
- Publication date May 31, 2018
- Paul Cornelis Hubertus ABEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND APPARATUS FOR CALCULATING SUBSTRATE MODEL PARAMETERS AN...
- Publication number 20170277045
- Publication date Sep 28, 2017
- ASML NETHERLANDS B.V.
- Jasper MENGER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Method and Apparatus and Lithographic Processing Cell
- Publication number 20140089870
- Publication date Mar 27, 2014
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G06 - COMPUTING CALCULATING COUNTING

Paul Cornelis Hubertus Aben

Person

Patents Grantslast 30 patents

Inspection method and apparatus and lithographic processing cell

Inspection method and apparatus and lithographic processing cell

Methods and apparatus for calculating substrate model parameters an...

Methods and apparatus for calculating substrate model parameters an...

Methods and apparatus for calculating substrate model parameters an...

Method for transferring a mark pattern to a substrate, a calibratio...

Inspection method and apparatus and lithographic processing cell

Patents Applicationslast 30 patents

METHODS AND APPARATUS FOR CALCULATING SUBSTRATE MODEL PARAMETERS AN...

METHODS AND APPARATUS FOR CALCULATING SUBSTRATE MODEL PARAMETERS AN...

METHOD FOR TRANSFERRING A MARK PATTERN TO A SUBSTRATE, A CALIBRATIO...

METHODS AND APPARATUS FOR CALCULATING SUBSTRATE MODEL PARAMETERS AN...

Inspection Method and Apparatus and Lithographic Processing Cell