Paul Douglas MacDonald

Person

Tracy, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reverse decoration for defect detection amplification
- Patent number 10,249,546
- Issue date Apr 2, 2019
- KLA-Tencor Corporation
- Philip Measor
- G01 - MEASURING TESTING
Information Patent Grant
Methods of and apparatuses for measuring electrical parameters of a...
- Patent number 9,029,728
- Issue date May 12, 2015
- KLA-Tencor Corporation
- Randall S. Mundt
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus to review defects using scanning electron mic...
- Patent number 8,716,662
- Issue date May 6, 2014
- KLA-Tencor Corporation
- Paul MacDonald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of and apparatuses for maintenance, diagnosis, and optimiza...
- Patent number 8,698,037
- Issue date Apr 15, 2014
- KLA-Tencor Corporation
- Randall S. Mundt
- G01 - MEASURING TESTING
Information Patent Grant
Methods of and apparatuses for measuring electrical parameters of a...
- Patent number 7,960,670
- Issue date Jun 14, 2011
- KLA-Tencor Corporation
- Randall S. Mundt
- G01 - MEASURING TESTING
Information Patent Grant
Methods of and apparatuses for maintenance, diagnosis, and optimiza...
- Patent number 7,580,767
- Issue date Aug 25, 2009
- KLA-Tencor Corporation
- Paul Douglas MacDonald
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatuses for and methods of monitoring optical radiation paramet...
- Patent number 7,482,576
- Issue date Jan 27, 2009
- KLA-Tencor Corporation
- Randall S. Mundt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Reverse Decoration for Defect Detection Amplification
- Publication number 20180025952
- Publication date Jan 25, 2018
- KLA-Tencor Corporation
- Philip Measor
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF AND APPARATUSES FOR MEASURING ELECTRICAL PARAMETERS OF A...
- Publication number 20140312916
- Publication date Oct 23, 2014
- KLA-Tencor Corporation
- Randall S. Mundt
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR REAL-TIME THREE-DIMENSIONAL SEM IMAGING A...
- Publication number 20120223227
- Publication date Sep 6, 2012
- Chien-Huei CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF AND APPARATUSES FOR MAINTENANCE, DIAGNOSIS, AND OPTIMIZA...
- Publication number 20110240610
- Publication date Oct 6, 2011
- KLA-Tencor Corporation
- Randall S. Mundt
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF AND APPARATUSES FOR MAINTENANCE, DIAGNOSIS, AND OPTIMIZA...
- Publication number 20090292506
- Publication date Nov 26, 2009
- KLA-Tencor Corporation
- Paul Douglas MacDonald
- G05 - CONTROLLING REGULATING
Information Patent Application
Methods of and apparatuses for maintenance, diagnosis, and optimiza...
- Publication number 20070055403
- Publication date Mar 8, 2007
- Paul Douglas MacDonald
- G05 - CONTROLLING REGULATING
Information Patent Application
Apparatuses for and methods of monitoring optical radiation paramet...
- Publication number 20060289763
- Publication date Dec 28, 2006
- Randall S. Mundt
- G01 - MEASURING TESTING
Information Patent Application
Methods of and apparatuses for measuring electrical parameters of a...
- Publication number 20060249729
- Publication date Nov 9, 2006
- Randall S. Mundt
- G01 - MEASURING TESTING

Paul Douglas MacDonald

Person

Patents Grantslast 30 patents

Reverse decoration for defect detection amplification

Methods of and apparatuses for measuring electrical parameters of a...

Methods and apparatus to review defects using scanning electron mic...

Methods of and apparatuses for maintenance, diagnosis, and optimiza...

Methods of and apparatuses for measuring electrical parameters of a...

Methods of and apparatuses for maintenance, diagnosis, and optimiza...

Apparatuses for and methods of monitoring optical radiation paramet...

Patents Applicationslast 30 patents

Reverse Decoration for Defect Detection Amplification

METHODS OF AND APPARATUSES FOR MEASURING ELECTRICAL PARAMETERS OF A...

APPARATUS AND METHODS FOR REAL-TIME THREE-DIMENSIONAL SEM IMAGING A...

METHODS OF AND APPARATUSES FOR MAINTENANCE, DIAGNOSIS, AND OPTIMIZA...

METHODS OF AND APPARATUSES FOR MAINTENANCE, DIAGNOSIS, AND OPTIMIZA...

Methods of and apparatuses for maintenance, diagnosis, and optimiza...

Apparatuses for and methods of monitoring optical radiation paramet...

Methods of and apparatuses for measuring electrical parameters of a...