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Paul Doyle
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Milpitas, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Active damper for semiconductor metrology and inspection systems
Patent number
11,280,381
Issue date
Mar 22, 2022
Onto Innovation Inc.
Paul A. Doyle
G01 - MEASURING TESTING
Information
Patent Grant
Non-adhesive mounting assembly for a tall Rochon polarizer
Patent number
10,914,916
Issue date
Feb 9, 2021
Onto Innovation Inc.
Andrew Saul Klassen
G02 - OPTICS
Information
Patent Grant
FOUP purge shield
Patent number
10,784,136
Issue date
Sep 22, 2020
Onto Innovation Inc.
Paul A. Doyle
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Local purge within metrology and inspection systems
Patent number
10,451,542
Issue date
Oct 22, 2019
Nanometrics Incorporated
Paul A. Doyle
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ACTIVE DAMPER FOR SEMICONDUCTOR METROLOGY AND INSPECTION SYSTEMS
Publication number
20200370619
Publication date
Nov 26, 2020
ONTO INNOVATION INC.
Paul A. DOYLE
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
FOUP PURGE SHIELD
Publication number
20200035531
Publication date
Jan 30, 2020
Nanometrics Incorporated
Paul A. DOYLE
B08 - CLEANING
Information
Patent Application
LOCAL PURGE WITHIN METROLOGY AND INSPECTION SYSTEMS
Publication number
20200011786
Publication date
Jan 9, 2020
Nanometrics Incorporated
Paul A. DOYLE
G01 - MEASURING TESTING
Information
Patent Application
LOCAL PURGE WITHIN METROLOGY AND INSPECTION SYSTEMS
Publication number
20190170634
Publication date
Jun 6, 2019
Nanometrics Incorporated
Paul A. DOYLE
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
NON-ADHESIVE MOUNTING ASSEMBLY FOR A TALL ROCHON POLARIZER
Publication number
20180259742
Publication date
Sep 13, 2018
Nanometrics Incorporated
Andrew Saul Klassen
G02 - OPTICS