Paul E. Fischione

Person

Export, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for preparing a sample for microscopy
- Patent number 9,779,914
- Issue date Oct 3, 2017
- E. A. Fischione Instruments, Inc.
- Paul E. Fischione
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source with independent power supplies
- Patent number 9,214,313
- Issue date Dec 15, 2015
- E. A. Fischione Instruments, Inc.
- Joseph M. Matesa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryogenic specimen holder
- Patent number 9,010,202
- Issue date Apr 21, 2015
- Halina Stabacinskiene
- G01 - MEASURING TESTING
Information Patent Grant
In situ holder assembly
- Patent number 8,698,098
- Issue date Apr 15, 2014
- E. A. Fischione Instruments, Inc.
- Pushkarraj V. Deshmukh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for preparing specimens for microscopy
- Patent number 8,679,307
- Issue date Mar 25, 2014
- E. A. Fischione Instruments, Inc.
- Paul E. Fischione
- G01 - MEASURING TESTING
Information Patent Grant
Cryogenic specimen holder
- Patent number 8,336,405
- Issue date Dec 25, 2012
- E. A. Fischione Instruments, Inc.
- Halina Stabacinskiene
- G01 - MEASURING TESTING
Information Patent Grant
In situ holder assembly
- Patent number 8,178,851
- Issue date May 15, 2012
- E. A. Fischione Instruments, Inc.
- Pushkarraj V. Deshmukh
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for milling of material using ions
- Patent number 7,504,623
- Issue date Mar 17, 2009
- E. A. Fischione Instruments, Inc.
- Paul E. Fischione
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen holding apparatus
- Patent number 7,219,565
- Issue date May 22, 2007
- E. A. Fischione Instruments, Inc.
- Paul E. Fischione
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for milling of material using ions
- Patent number 7,132,673
- Issue date Nov 7, 2006
- E. A. Fischione Instruments, Inc.
- Paul E. Fischione
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing system for transmission electron microscopy speci...
- Patent number 5,633,502
- Issue date May 27, 1997
- E. A. Fischione Instruments, Inc.
- Paul E. Fischione
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Uniform Ion Milling
- Publication number 20220262593
- Publication date Aug 18, 2022
- E.A. Fischione Instruments, Inc.
- Paul E. Fischione
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for Preparing a Sample for Microscopy
- Publication number 20160027612
- Publication date Jan 28, 2016
- E.A. Fischione lnstruments, lnc.
- Paul E. Fischione
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for Preparing Specimens for Microscopy
- Publication number 20140157914
- Publication date Jun 12, 2014
- Paul E. Fischione
- G01 - MEASURING TESTING
Information Patent Application
Method for Preparing Specimens for Microscopy
- Publication number 20140098380
- Publication date Apr 10, 2014
- Paul E. Fischione
- G01 - MEASURING TESTING
Information Patent Application
IN SITU HOLDER ASSEMBLY
- Publication number 20130119267
- Publication date May 16, 2013
- E.A. Fischione Instruments, Inc.
- Pushkarraj V. Deshmukh
- G01 - MEASURING TESTING
Information Patent Application
CRYOGENIC SPECIMEN HOLDER
- Publication number 20130014528
- Publication date Jan 17, 2013
- E.A. FISCHIONE, INC.
- Halina Stabacinskiene
- G01 - MEASURING TESTING
Information Patent Application
CRYOGENIC SPECIMEN HOLDER
- Publication number 20120024086
- Publication date Feb 2, 2012
- Halina Stabacinskiene
- G01 - MEASURING TESTING
Information Patent Application
IN SITU HOLDER ASSEMBLY
- Publication number 20120025103
- Publication date Feb 2, 2012
- Pushkarraj V. Deshmukh
- G01 - MEASURING TESTING
Information Patent Application
ION SOURCE
- Publication number 20110248179
- Publication date Oct 13, 2011
- E.A. Fischione Instruments, Inc.
- Joseph M. Matesa, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device and method for milling of material using ions
- Publication number 20060022148
- Publication date Feb 2, 2006
- Paul E. Fischione
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for preparing specimens for microscopy
- Publication number 20040108067
- Publication date Jun 10, 2004
- Paul E. Fischione
- G01 - MEASURING TESTING
Information Patent Application
Specimen holding apparatus
- Publication number 20040003666
- Publication date Jan 8, 2004
- Paul E. Fischione
- H01 - BASIC ELECTRIC ELEMENTS

Paul E. Fischione

Person

Patents Grantslast 30 patents

Apparatus for preparing a sample for microscopy

Ion source with independent power supplies

Cryogenic specimen holder

In situ holder assembly

Method and apparatus for preparing specimens for microscopy

Cryogenic specimen holder

In situ holder assembly

Device and method for milling of material using ions

Specimen holding apparatus

Device and method for milling of material using ions

Plasma processing system for transmission electron microscopy speci...

Patents Applicationslast 30 patents

System and Method for Uniform Ion Milling

Apparatus for Preparing a Sample for Microscopy

Apparatus for Preparing Specimens for Microscopy

Method for Preparing Specimens for Microscopy

IN SITU HOLDER ASSEMBLY

CRYOGENIC SPECIMEN HOLDER

CRYOGENIC SPECIMEN HOLDER

IN SITU HOLDER ASSEMBLY

ION SOURCE

Device and method for milling of material using ions

Method and apparatus for preparing specimens for microscopy

Specimen holding apparatus