Paul E. Larson

Person

Bloomington, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus to provide parallel acquisition of mass spectr...
- Patent number 9,159,539
- Issue date Oct 13, 2015
- ULVAC-PHI, INCORPORATED
- Paul E. Larson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder apparatus to reduce energy of electrons in an analyze...
- Patent number 8,071,942
- Issue date Dec 6, 2011
- Physical Electronics USA, Inc.
- David G. Watson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for depth profiling and characterization of thin...
- Patent number 7,449,682
- Issue date Nov 11, 2008
- ReVera Incorporated
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive characterization of thin films based on acquired spe...
- Patent number 6,891,158
- Issue date May 10, 2005
- ReVera Incorporated
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive characterization of thin films using measured basis...
- Patent number 6,800,852
- Issue date Oct 5, 2004
- ReVera Incorporated
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Control of surface potential of insulating specimens in surface ana...
- Patent number 5,990,476
- Issue date Nov 23, 1999
- Physical Electronics Inc.
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Anode assembly for generating x-rays and instrument with such anode...
- Patent number 5,602,899
- Issue date Feb 11, 1997
- Physical Electronics Inc.
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Scanning and high resolution electron spectroscopy and imaging
- Patent number 5,444,242
- Issue date Aug 22, 1995
- Physical Electronics Inc.
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Scanning and high resolution x-ray photoelectron spectroscopy and i...
- Patent number 5,315,113
- Issue date May 24, 1994
- The Perkin-Elmer Corporation
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for locating target area for electron microana...
- Patent number 5,118,941
- Issue date Jun 2, 1992
- The Perkin-Elmer Corporation
- Paul E. Larson
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS TO PROVIDE PARALLEL ACQUISITION OF MASS SPECTR...
- Publication number 20150090874
- Publication date Apr 2, 2015
- ULVAC-PHI, INCORPORATED
- Paul E. Larson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER APPARATUS TO REDUCE ENERGY OF ELECTRONS IN AN ANALYZE...
- Publication number 20100237240
- Publication date Sep 23, 2010
- Physical Electronics USA, Inc.
- David G. Watson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for depth profiling and characterization of thin...
- Publication number 20040238735
- Publication date Dec 2, 2004
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Application
Nondestructive characterization of thin films using measured basis...
- Publication number 20040135081
- Publication date Jul 15, 2004
- Physical Electronics, Inc.
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Application
Nondestructive characterization of thin films based on acquired spe...
- Publication number 20040125913
- Publication date Jul 1, 2004
- Physical Electronics, Inc.
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Application
System and method for depth profiling
- Publication number 20030080292
- Publication date May 1, 2003
- Physical Electronics, Inc.
- David G. Watson
- G01 - MEASURING TESTING
Information Patent Application
System and method for characterization of thin films
- Publication number 20030080291
- Publication date May 1, 2003
- Physical Electronics, Inc.
- Paul E. Larson
- G01 - MEASURING TESTING

Paul E. Larson

Person

Patents Grantslast 30 patents

Method and apparatus to provide parallel acquisition of mass spectr...

Sample holder apparatus to reduce energy of electrons in an analyze...

System and method for depth profiling and characterization of thin...

Nondestructive characterization of thin films based on acquired spe...

Nondestructive characterization of thin films using measured basis...

Control of surface potential of insulating specimens in surface ana...

Anode assembly for generating x-rays and instrument with such anode...

Scanning and high resolution electron spectroscopy and imaging

Scanning and high resolution x-ray photoelectron spectroscopy and i...

Apparatus and method for locating target area for electron microana...

Patents Applicationslast 30 patents

METHOD AND APPARATUS TO PROVIDE PARALLEL ACQUISITION OF MASS SPECTR...

SAMPLE HOLDER APPARATUS TO REDUCE ENERGY OF ELECTRONS IN AN ANALYZE...

System and method for depth profiling and characterization of thin...

Nondestructive characterization of thin films using measured basis...

Nondestructive characterization of thin films based on acquired spe...

System and method for depth profiling

System and method for characterization of thin films