Paul E. Nicollian

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and circuit for simulating gate-to-drain breakdown
- Patent number 8,554,531
- Issue date Oct 8, 2013
- Texas Instruments Incorporated
- Paul E. Nicollian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Current-voltage-based method for evaluating thin dielectrics based...
- Patent number 7,737,717
- Issue date Jun 15, 2010
- Texas Instruments Incorporated
- Paul Edward Nicollian
- G01 - MEASURING TESTING
Information Patent Grant
Process related damage monitor (predator)--systematic variation of...
- Patent number 6,016,062
- Issue date Jan 18, 2000
- Texas Instruments Incorporated
- Paul Nicollian
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Low defect density composite dielectric
- Patent number 5,969,397
- Issue date Oct 19, 1999
- Texas Instruments Incorporated
- Douglas Ticknor Grider
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND CIRCUIT FOR SIMULATING GATE-TO-DRAIN BREAKDOWN
- Publication number 20120043619
- Publication date Feb 23, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Paul E. NICOLLIAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CURRENT-VOLTAGE-BASED METHOD FOR EVALUATING THIN DIELECTRICS BASED...
- Publication number 20090224795
- Publication date Sep 10, 2009
- Texas Instruments Inc.
- Paul Edward Nicollian
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having a dielectric layer with a uniform nitro...
- Publication number 20030157773
- Publication date Aug 21, 2003
- Jerry Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a dielectric layer with a uniform nitro...
- Publication number 20030080389
- Publication date May 1, 2003
- Jerry Hu
- H01 - BASIC ELECTRIC ELEMENTS