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Paul E. West
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Cupertino, CA, US
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last 30 patents
Information
Patent Grant
Scanning probe microscope apparatus for use in a scanning electron...
Patent number
5,510,615
Issue date
Apr 23, 1996
TopoMetrix Corporation
Huddee Ho
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Synchronous sampling scanning force microscope
Patent number
5,507,179
Issue date
Apr 16, 1996
Topometrix
Ronald C. Gamble
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope apparatus for use in a scanning electron
Patent number
5,455,420
Issue date
Oct 3, 1995
Topometrix
Huddee Ho
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Thermal sensing scanning probe microscope and method for measuremen...
Patent number
5,441,343
Issue date
Aug 15, 1995
TopoMetrix Corporation
Russell J. Pylkki
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Synchronous sampling scanning force microscope
Patent number
5,406,832
Issue date
Apr 18, 1995
TopoMetrix Corporation
Ronald C. Gamble
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning force microscope
Patent number
5,319,960
Issue date
Jun 14, 1994
Topometrix
Ronald C. Gamble
B82 - NANO-TECHNOLOGY
Information
Patent Grant
High resolution electromechanical translation device
Patent number
5,260,622
Issue date
Nov 9, 1993
TopoMetrix Corporation
Paul E. West
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER