Paul Evans

Person

Nottingham, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Sample inspection system comprising a beam former to project a poly...
- Patent number 11,971,371
- Issue date Apr 30, 2024
- The Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Sample inspection apparatus employing a diffraction detector
- Patent number 11,726,048
- Issue date Aug 15, 2023
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection system
- Patent number 11,624,717
- Issue date Apr 11, 2023
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection apparatus employing a diffraction detector
- Patent number 11,467,104
- Issue date Oct 11, 2022
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection apparatus employing a diffraction detector
- Patent number 10,948,432
- Issue date Mar 16, 2021
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction imaging system using debye ring envelopes
- Patent number 9,921,173
- Issue date Mar 20, 2018
- The Nottingham Trent University
- Paul Evans
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Sample analysis
- Patent number 9,063,065
- Issue date Jun 23, 2015
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Detection of X-ray scattering
- Patent number 8,462,913
- Issue date Jun 11, 2013
- Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Line-scan imaging in 3-D
- Patent number 6,795,575
- Issue date Sep 21, 2004
- Nottingham Trent University
- Max Robinson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE INSPECTION APPARATUS EMPLOYING A DIFFRACTION DETECTOR
- Publication number 20230012499
- Publication date Jan 19, 2023
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
A SAMPLE INSPECTION SYSTEM
- Publication number 20220381710
- Publication date Dec 1, 2022
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
A SAMPLE INSPECTION SYSTEM
- Publication number 20210293728
- Publication date Sep 23, 2021
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION APPARATUS EMPLOYING A DIFFRACTION DETECTOR
- Publication number 20210199605
- Publication date Jul 1, 2021
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION APPARATUS EMPLOYING A DIFFRACTION DETECTOR
- Publication number 20200057010
- Publication date Feb 20, 2020
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Diffraction Imaging System Using Debye Ring Envelopes
- Publication number 20150362443
- Publication date Dec 17, 2015
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS
- Publication number 20130208859
- Publication date Aug 15, 2013
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF X-RAY SCATTERING
- Publication number 20100254514
- Publication date Oct 7, 2010
- Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Person

Patents Grantslast 30 patents

Sample inspection system comprising a beam former to project a poly...

Sample inspection apparatus employing a diffraction detector

Sample inspection system

Sample inspection apparatus employing a diffraction detector

Sample inspection apparatus employing a diffraction detector

X-ray diffraction imaging system using debye ring envelopes

Sample analysis

Detection of X-ray scattering

Line-scan imaging in 3-D

Patents Applicationslast 30 patents

SAMPLE INSPECTION APPARATUS EMPLOYING A DIFFRACTION DETECTOR

A SAMPLE INSPECTION SYSTEM

A SAMPLE INSPECTION SYSTEM

SAMPLE INSPECTION APPARATUS EMPLOYING A DIFFRACTION DETECTOR

SAMPLE INSPECTION APPARATUS EMPLOYING A DIFFRACTION DETECTOR

X-Ray Diffraction Imaging System Using Debye Ring Envelopes

SAMPLE ANALYSIS

DETECTION OF X-RAY SCATTERING