Membership
Tour
Register
Log in
Paul F. Marella
Follow
Person
San Jose, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Methods and systems for inspection of wafers and reticles using des...
Patent number
11,348,222
Issue date
May 31, 2022
KLA-Tencor Technologies Corp.
Paul Frank Marella
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and systems for inspection of wafers and reticles using des...
Patent number
10,713,771
Issue date
Jul 14, 2020
KLA-Tencor Technologies Corp.
Paul Frank Marella
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and systems for inspection of wafers and reticles using des...
Patent number
9,002,497
Issue date
Apr 7, 2015
KLA-Tencor Technologies Corp.
William Volk
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for inspection of a specimen using different in...
Patent number
8,384,887
Issue date
Feb 26, 2013
KLA-Tencor Technologies Corp.
Steve R. Lange
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for inspection of a specimen using different in...
Patent number
7,738,089
Issue date
Jun 15, 2010
KLA-Tencor Technologies Corp.
Steve R. Lange
G01 - MEASURING TESTING
Information
Patent Grant
Electrical process monitoring using mirror-mode electron microscopy
Patent number
7,514,681
Issue date
Apr 7, 2009
KLA-Tencor Technologies Corporation
Paul F. Marella
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for closed loop defect reduction
Patent number
7,236,847
Issue date
Jun 26, 2007
KLA-Tencor Technologies Corp.
Paul Frank Marella
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
Publication number
20200074619
Publication date
Mar 5, 2020
KLA-Tencor Technologies Corporation
Paul Frank Marella
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
Publication number
20180247403
Publication date
Aug 30, 2018
KLA-Tencor Technologies Corporation
Paul Frank Marella
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Methods and Systems for Inspection of Wafers and Reticles Using Des...
Publication number
20150178914
Publication date
Jun 25, 2015
KLA-Tencor Technologies Corporation
Paul Frank Marella
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF A SPECIMEN USING DIFFERENT IN...
Publication number
20100238433
Publication date
Sep 23, 2010
KLA-Tencor Technologies Corporation
Steve R. Lange
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
Publication number
20080081385
Publication date
Apr 3, 2008
Paul Frank Marella
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Methods and systems for inspection of a specimen using different in...
Publication number
20050052643
Publication date
Mar 10, 2005
Steve R. Lange
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for inspection of wafers and reticles using des...
Publication number
20050004774
Publication date
Jan 6, 2005
William Volk
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems and methods for closed loop defect reduction
Publication number
20030139838
Publication date
Jul 24, 2003
Paul Frank Marella
G01 - MEASURING TESTING