Paul F. Policke

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit including constant-0 flip flops reconfigured to...
- Patent number 12,130,330
- Issue date Oct 29, 2024
- QUALCOMM Incorporated
- Paul Policke
- G01 - MEASURING TESTING
Information Patent Grant
On-chip clock controller
- Patent number 9,740,234
- Issue date Aug 22, 2017
- QUALCOMM Incorporated
- Hong Kim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Feedback scan isolation and scan bypass architecture
- Patent number 8,627,159
- Issue date Jan 7, 2014
- QUALCOMM Incorporated
- Paul F. Policke
- G01 - MEASURING TESTING
Information Patent Grant
Debugger based memory dump using built in self test
- Patent number 8,527,825
- Issue date Sep 3, 2013
- QUALCOMM Incorporated
- Hong S. Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Logic built-in self-test programmable pattern bit mask
- Patent number 8,522,097
- Issue date Aug 27, 2013
- QUALCOMM Incorporated
- Hong S. Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT INCLUDING CONSTANT-0 FLIP FLOPS RECONFIGURED TO...
- Publication number 20250027993
- Publication date Jan 23, 2025
- QUALCOMM Incorporated
- Paul POLICKE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT INCLUDING CONSTANT-0 FLIP FLOPS RECONFIGURED TO...
- Publication number 20240248136
- Publication date Jul 25, 2024
- QUALCOMM Incorporated
- Paul POLICKE
- G01 - MEASURING TESTING
Information Patent Application
DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CI...
- Publication number 20240111934
- Publication date Apr 4, 2024
- QUALCOMM Incorporated
- Ripu SINGH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Feedback Scan Isolation and Scan Bypass Architecture
- Publication number 20120124433
- Publication date May 17, 2012
- QUALCOMM Incorporated
- Paul F. Policke
- G01 - MEASURING TESTING
Information Patent Application
Debugger Based Memory Dump Using Built in Self Test
- Publication number 20120072791
- Publication date Mar 22, 2012
- QUALCOMM Incorporated
- Hong S. Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Logic Built-In Self-Test Programmable Pattern Bit Mask
- Publication number 20110231719
- Publication date Sep 22, 2011
- QUALCOMM Incorporated
- Hong S. Kim
- G01 - MEASURING TESTING