Paul Francis Wilson

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Richmond, NZ

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Patents Grantslast 30 patents

Information Patent Grant
Method of chemical ionization mass spectrometry
- Patent number 7,785,893
- Issue date Aug 31, 2010
- SYFT Technologies Limited
- Murray James McEwan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SIFT-MS INSTRUMENT
- Publication number 20110024614
- Publication date Feb 3, 2011
- SYFT Technologies Limited
- Paul Francis Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sift-Ms Instruments
- Publication number 20070278403
- Publication date Dec 6, 2007
- Murray James McEwan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of chemical ionization mass spectrometry
- Publication number 20050255603
- Publication date Nov 17, 2005
- Murray James McEwan
- H01 - BASIC ELECTRIC ELEMENTS