Paul-Henri Pugliesi-Conti

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Hermanville sur Mer, FR

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Patents Grantslast 30 patents

Information Patent Grant
Circuit for securing scan chain data
- Patent number 9,746,519
- Issue date Aug 29, 2017
- NXP B.V.
- Paul-Henri Pugliesi-Conti
- G01 - MEASURING TESTING
Information Patent Grant
Secure low pin count scan
- Patent number 9,170,297
- Issue date Oct 27, 2015
- NXP B.V.
- Paul-Henri Pugliesi-Conti
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-clock system-on-chip with universal clock control modules for...
- Patent number 7,900,108
- Issue date Mar 1, 2011
- NXP B.V.
- Paul-Henri Pugliesi-Conti
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SECURE LOW PIN COUNT SCAN
- Publication number 20130166977
- Publication date Jun 27, 2013
- NXP B.V.
- Paul-Henri Pugliesi-Conti
- G01 - MEASURING TESTING
Information Patent Application
Circuit for Securing Scan Chain Data
- Publication number 20120246528
- Publication date Sep 27, 2012
- Paul-Henri Pugliesi-Conti
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CLOCK SYSTEM-ON-CHIP WITH UNIVERSAL CLOCK CONTROL MODULES FOR...
- Publication number 20100011264
- Publication date Jan 14, 2010
- NXP, B.V.
- Paul-Henri Pugliesi-Conti
- G01 - MEASURING TESTING