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Paul J. Clapis
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Sandy Hook, CT, US
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last 30 patents
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Patent Grant
Method for co-registering semiconductor wafers undergoing work in o...
Patent number
5,610,102
Issue date
Mar 11, 1997
Integrated Process Equipment Corp.
George J. Gardopee
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Method and apparatus for measuring film thickness in multilayer thi...
Patent number
5,555,472
Issue date
Sep 10, 1996
Integrated Process Equipment Corp.
Paul J. Clapis
G01 - MEASURING TESTING