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Paul J. Freud
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Furlong, PA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for measuring zeta potential of suspended part...
Patent number
8,451,434
Issue date
May 28, 2013
Microtrac Inc.
Paul J Freud
G01 - MEASURING TESTING
Information
Patent Grant
Optical waveguide probe having variable gap focusing
Patent number
6,396,979
Issue date
May 28, 2002
Microtrac, Inc.
Paul J. Freud
G02 - OPTICS
Information
Patent Grant
In-line diluting extractor
Patent number
6,178,830
Issue date
Jan 30, 2001
Microtrac, Inc.
Paul J. Freud
G01 - MEASURING TESTING
Information
Patent Grant
System for the in-line extraction and dilution of a representative...
Patent number
6,020,960
Issue date
Feb 1, 2000
Honeywell Inc.
Paul J. Freud
G01 - MEASURING TESTING
Information
Patent Grant
Sampling and diluting system for particle size distribution measure...
Patent number
6,007,235
Issue date
Dec 28, 1999
Honeywell Inc.
Paul J. Freud
G01 - MEASURING TESTING
Information
Patent Grant
Low power signal processing and measurement apparatus
Patent number
5,650,571
Issue date
Jul 22, 1997
Paul J. Freud
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic light scattering microvolume cell assembly for continuous f...
Patent number
5,485,270
Issue date
Jan 16, 1996
General Signal Corporation
Paul J. Freud
G01 - MEASURING TESTING
Information
Patent Grant
Integrated optical waveguide doppler velocimeter
Patent number
5,094,526
Issue date
Mar 10, 1992
General Signal Corporation
Paul J. Freud
G01 - MEASURING TESTING
Information
Patent Grant
Remote probe differential pressure transducer
Patent number
4,599,906
Issue date
Jul 15, 1986
General Signal Corporation
Paul J. Freud
G01 - MEASURING TESTING
Information
Patent Grant
Humidity sensing element
Patent number
4,564,882
Issue date
Jan 14, 1986
General Signal Corporation
Ronald D. Baxter
G01 - MEASURING TESTING
Information
Patent Grant
Pressure transducer and mounting
Patent number
4,542,435
Issue date
Sep 17, 1985
General Signal Corporation
Paul J. Freud
G01 - MEASURING TESTING
Information
Patent Grant
Thin film resistance thermometer with a predetermined temperature c...
Patent number
4,469,717
Issue date
Sep 4, 1984
Leeds & Northrup Company
Ronald D. Baxter
G01 - MEASURING TESTING
Information
Patent Grant
Humidity sensing element
Patent number
4,429,343
Issue date
Jan 31, 1984
Leeds & Northrup Company
Paul J. Freud
G01 - MEASURING TESTING
Information
Patent Grant
Silicon diaphragm capacitive pressure transducer
Patent number
4,424,713
Issue date
Jan 10, 1984
General Signal Corporation
Paul M. Kroninger
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-cavity variable capacitance pressure transducer
Patent number
4,390,925
Issue date
Jun 28, 1983
Leeds & Northrup Company
Paul J. Freud
G01 - MEASURING TESTING
Information
Patent Grant
Thin film resistance thermometer device with a predetermined temper...
Patent number
4,375,056
Issue date
Feb 22, 1983
Leeds & Northrup Company
Ronald D. Baxter
G01 - MEASURING TESTING
Information
Patent Grant
Thin film resistance thermometer detector probe assembly
Patent number
4,242,659
Issue date
Dec 30, 1980
Leeds & Northrup Company
Ronald D. Baxter
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR MEASURING ZETA POTENTIAL OF SUSPENDED PART...
Publication number
20110037980
Publication date
Feb 17, 2011
Microtrac Inc.
Paul J. Freud
G01 - MEASURING TESTING