Paul J. Sullivan

Person

Campbell, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for scanning, stitching and damping measuremen...
- Patent number 7,663,746
- Issue date Feb 16, 2010
- KLA-Tencor Techologies Corporation
- Paul J. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for scanning, stitching, and damping measureme...
- Patent number 7,436,506
- Issue date Oct 14, 2008
- KLA-Tencor Corporation
- Paul J. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection systems and methods for analyzing inspection data
- Patent number 7,417,724
- Issue date Aug 26, 2008
- KLA-Tencor Technologies Corp.
- Paul Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection systems and methods for analyzing inspection data
- Patent number 7,227,628
- Issue date Jun 5, 2007
- KLA-Tencor Technologies Corp.
- Paul Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Darkfield inspection system having a programmable light selection a...
- Patent number 7,199,874
- Issue date Apr 3, 2007
- KLA-Tencor Technologies Corporation
- Christopher F. Bevis
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for scanning, stitching, and damping measureme...
- Patent number 7,009,696
- Issue date Mar 7, 2006
- KLA-Tencor Corporation
- Paul J. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Darkfield inspection system having a programmable light selection a...
- Patent number 7,002,677
- Issue date Feb 21, 2006
- KLA-Tencor Technologies Corporation
- Christopher F. Bevis
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for scanning, stitching, and damping measureme...
- Patent number 6,686,996
- Issue date Feb 3, 2004
- KLA-Tencor Corporation
- Paul J. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for scanning, stitching, and damping measureme...
- Patent number 6,414,752
- Issue date Jul 2, 2002
- KLA-Tencor Technologies Corporation
- Paul J. Sullivan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for scanning, stitching and damping measuremen...
- Publication number 20090040514
- Publication date Feb 12, 2009
- KLA-Tencor Technologies Corporation
- Paul J. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for scanning, stitching, and damping measureme...
- Publication number 20060232770
- Publication date Oct 19, 2006
- Paul J. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
Darkfield inspection system having a programmable light selection a...
- Publication number 20060082767
- Publication date Apr 20, 2006
- KLA-Tencor Technologies Corporation
- Christopher F. Bevis
- G01 - MEASURING TESTING
Information Patent Application
Darkfield inspection system having a programmable light selection a...
- Publication number 20050018179
- Publication date Jan 27, 2005
- KLA-Tencor Technologies Corporation
- Christopher F. Bevis
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for scanning, stitching, and damping measureme...
- Publication number 20040145733
- Publication date Jul 29, 2004
- KLA-Tencor Corporation
- Paul J. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for scanning, stitching, and damping measureme...
- Publication number 20020154296
- Publication date Oct 24, 2002
- KLA-Tencor Corporation
- Paul J. Sullivan
- G01 - MEASURING TESTING

Paul J. Sullivan

Person

Patents Grantslast 30 patents

Method and apparatus for scanning, stitching and damping measuremen...

Method and apparatus for scanning, stitching, and damping measureme...

Wafer inspection systems and methods for analyzing inspection data

Wafer inspection systems and methods for analyzing inspection data

Darkfield inspection system having a programmable light selection a...

Method and apparatus for scanning, stitching, and damping measureme...

Darkfield inspection system having a programmable light selection a...

Method and apparatus for scanning, stitching, and damping measureme...

Method and apparatus for scanning, stitching, and damping measureme...

Patents Applicationslast 30 patents

Method and apparatus for scanning, stitching and damping measuremen...

Method and apparatus for scanning, stitching, and damping measureme...

Darkfield inspection system having a programmable light selection a...

Darkfield inspection system having a programmable light selection a...

Method and apparatus for scanning, stitching, and damping measureme...

Method and apparatus for scanning, stitching, and damping measureme...