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Paul J. Wheatley
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Titusville, NJ, US
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Patents Grants
last 30 patents
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Patent Grant
System and method for adaptable testing of backplane interconnectio...
Patent number
7,265,556
Issue date
Sep 4, 2007
Lucent Technologies Inc.
Bradford G. Van Treuren
G01 - MEASURING TESTING
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Patent Grant
System for flexible embedded Boundary Scan testing
Patent number
7,149,943
Issue date
Dec 12, 2006
Lucent Technologies Inc.
Bradford G. Van Treuren
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
System and method for adaptable testing of backplane interconnectio...
Publication number
20070069737
Publication date
Mar 29, 2007
Lucent Technologies Inc.
Bradford G. Van Treuren
G01 - MEASURING TESTING
Information
Patent Application
System for flexible embedded Boundary Scan testing
Publication number
20050154949
Publication date
Jul 14, 2005
LUCENT TECHNOLOGIES INC.
Bradford G. Van Treuren
G01 - MEASURING TESTING