Paul John Dabrowski

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Redwood City, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Aberration-correcting dark-field electron microscopy
- Patent number 8,569,694
- Issue date Oct 29, 2013
- Mochii, Inc.
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration-correcting dark-field electron microscopy
- Patent number 8,324,574
- Issue date Dec 4, 2012
- Mochii, Inc.
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ABERRATION-CORRECTING DARK-FIELD ELECTRON MICROSCOPY
- Publication number 20130043387
- Publication date Feb 21, 2013
- MOCHII, INC. (D/B/A VOXA)
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION-CORRECTING DARK-FIELD ELECTRON MICROSCOPY
- Publication number 20110192976
- Publication date Aug 11, 2011
- Halcyon Molecular, Inc.
- Christopher Su-Yan OWN
- H01 - BASIC ELECTRIC ELEMENTS