Paul Jung

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Florstadt, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for optically inspecting a wafer by sequentially illuminatin...
- Patent number 7,460,219
- Issue date Dec 2, 2008
- Vistec Semiconductor Systems GmbH
- Paul-Gottfried Jung
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for inspecting a wafer
- Publication number 20050168729
- Publication date Aug 4, 2005
- Leica Microsystems Semiconductor GmbH
- Paul Jung
- G01 - MEASURING TESTING