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Aalen, DE
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last 30 patents
Information
Patent Grant
Projection exposure system for microlithography with a measurement...
Patent number
10,042,271
Issue date
Aug 7, 2018
Carl Zeiss SMT GmbH
Ulrich Mueller
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Projection exposure system for microlithography with a measurement...
Patent number
9,696,639
Issue date
Jul 4, 2017
Carl Zeiss SMT GmbH
Ulrich Mueller
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Projection exposure system for microlithography with a measurement...
Patent number
9,001,304
Issue date
Apr 7, 2015
Carl Zeiss SMT GmbH
Ulrich Mueller
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical bench
Patent number
6,788,476
Issue date
Sep 7, 2004
Carl Zeiss SMT AG
Armin Schöppach
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PROJECTION EXPOSURE SYSTEM FOR MICROLITHOGRAPHY WITH A MEASUREMENT...
Publication number
20190129318
Publication date
May 2, 2019
Carl Zeiss SMT GMBH
Ulrich Mueller
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
PROJECTION EXPOSURE SYSTEM FOR MICROLITHOGRAPHY WITH A MEASUREMENT...
Publication number
20180024445
Publication date
Jan 25, 2018
Carl Zeiss SMT GMBH
Ulrich Mueller
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
PROJECTION EXPOSURE SYSTEM FOR MICROLITHOGRAPHY WITH A MEASUREMENT...
Publication number
20150212431
Publication date
Jul 30, 2015
Carl Zeiss SMT GMBH
Ulrich Mueller
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
PROJECTION EXPOSURE SYSTEM FOR MICROLITHOGRAPHY WITH A MEASUREMENT...
Publication number
20110013171
Publication date
Jan 20, 2011
Carl Zeiss SMT AG
Ulrich Mueller
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Optical bench
Publication number
20020191308
Publication date
Dec 19, 2002
Armin Schoppach
G01 - MEASURING TESTING
Information
Patent Application
Optical system
Publication number
20020186479
Publication date
Dec 12, 2002
Armin Schoppach
G02 - OPTICS