Paul L. Pfaff

Person

Lake Oswego, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods for obtaining and analyzing digital interferometric data fo...
- Patent number 9,952,161
- Issue date Apr 24, 2018
- Attofemto, Inc.
- Paul L. Pfaff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical to optical methods enhancing the sensitivity and resolution...
- Patent number 9,366,719
- Issue date Jun 14, 2016
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Multiple beam transmission interferometric testing methods for the...
- Patent number 9,250,064
- Issue date Feb 2, 2016
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Multiple optical wavelength interferometric testing methods for the...
- Patent number 8,879,071
- Issue date Nov 4, 2014
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Methods and processes for optical interferometric or holographic te...
- Patent number 8,736,823
- Issue date May 27, 2014
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Optically enhanced holographic interferometric testing methods for...
- Patent number 8,462,350
- Issue date Jun 11, 2013
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Optical to optical infrared imaging detection system
- Patent number 8,405,823
- Issue date Mar 26, 2013
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Methods for optically enhanced holographic interferometric testing...
- Patent number 8,139,228
- Issue date Mar 20, 2012
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Holographic condition assessment system for a structure including a...
- Patent number 8,040,521
- Issue date Oct 18, 2011
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric condition assessment system for a microelectronic s...
- Patent number 7,773,230
- Issue date Aug 10, 2010
- Attofemto, Inc.
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Method for optically testing semiconductor devices
- Patent number 7,733,499
- Issue date Jun 8, 2010
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Condition assessment method for a structure including a semiconduct...
- Patent number 7,728,958
- Issue date Jun 1, 2010
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Condition assessment system for a structure including a semiconduct...
- Patent number 7,420,687
- Issue date Sep 2, 2008
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Method for optically testing semiconductor devices
- Patent number 7,400,411
- Issue date Jul 15, 2008
- Attofemto, Inc.
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Voltage testing and measurement
- Patent number 7,323,889
- Issue date Jan 29, 2008
- Attofemto, Inc.
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive testing system using a laser beam
- Patent number 7,206,078
- Issue date Apr 17, 2007
- Attofemto, Inc.
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Voltage testing and measurement
- Patent number 6,972,577
- Issue date Dec 6, 2005
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Voltage testing and measurement
- Patent number 6,803,777
- Issue date Oct 12, 2004
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a device under test including the interference o...
- Patent number 6,512,385
- Issue date Jan 28, 2003
- Paul Pfaff
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical methods for obtaining digital data to be used in determinin...
- Publication number 20180246045
- Publication date Aug 30, 2018
- Attofemto, Inc.
- Paul L. Pfaff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADVANCED 4-DIMENSIONAL SIGNAL AND DEVICE TESTING USING CIRCUIT-STAT...
- Publication number 20160291088
- Publication date Oct 6, 2016
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE BEAM TRANSMISSION INTERFEROMETRIC TESTING METHODS FOR THE...
- Publication number 20160195479
- Publication date Jul 7, 2016
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE BEAM TRANSMISSION INTERFEROMETRIC TESTING METHODS FOR THE...
- Publication number 20150041657
- Publication date Feb 12, 2015
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TO OPTICAL TIME AND SPATIAL RESOLUTION ENHANCEMENTS FOR IMP...
- Publication number 20140103935
- Publication date Apr 17, 2014
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE OPTICAL WAVELENGTH INTERFEROMETRIC TESTING METHODS FOR THE...
- Publication number 20130337585
- Publication date Dec 19, 2013
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND PROCESSES FOR OPTICAL INTERFEROMETRIC OR HOLOGRAPHIC TE...
- Publication number 20130181722
- Publication date Jul 18, 2013
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
HOLOGRAPHIC CONDITION ASSESSMENT SYSTEM FOR A STRUCTURE INCLUDING A...
- Publication number 20120133922
- Publication date May 31, 2012
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
OPTICALLY ENHANCED HOLOGRAPHIC INTERFEROMETRIC TESTING METHODS FOR...
- Publication number 20120127473
- Publication date May 24, 2012
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPTICALLY ENHANCED HOLOGRAHIC INTERFEROMETRIC TESTING FO...
- Publication number 20110122415
- Publication date May 26, 2011
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
HOLOGRAPHIC CONDITION ASSESSMENT SYSTEM FOR A STRUCTURE INCLUDING A...
- Publication number 20100091292
- Publication date Apr 15, 2010
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
CONDITION ASSESSMENT SYSTEM FOR A STRUCTURE INCLUDING A SEMICONDUCT...
- Publication number 20090002717
- Publication date Jan 1, 2009
- Attofemto, Inc.
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPTICALLY TESTING SEMICONDUCTOR DEVICES
- Publication number 20080252898
- Publication date Oct 16, 2008
- Attofemto, Inc.
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Application
CONDITION ASSESSMENT METHOD FOR A STRUCTURE INCLUDING A SEMICONDUCT...
- Publication number 20080186580
- Publication date Aug 7, 2008
- ATTOFEMTO, INC.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
CONDITION ASSESSMENT METHOD FOR A STRUCTURE INCLUDING A SEMICONDUCT...
- Publication number 20070018662
- Publication date Jan 25, 2007
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
CONDITION ASSESSMENT SYSTEM FOR A STRUCTURE INCLUDING A SEMICONDUCT...
- Publication number 20070019209
- Publication date Jan 25, 2007
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE TESTING SYSTEM
- Publication number 20060244974
- Publication date Nov 2, 2006
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
Non-destructive testing system
- Publication number 20050231733
- Publication date Oct 20, 2005
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Application
Voltage testing and measurement
- Publication number 20050156609
- Publication date Jul 21, 2005
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Application
Voltage testing and measurement
- Publication number 20040046577
- Publication date Mar 11, 2004
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Application
Voltage testing and measurement
- Publication number 20030067312
- Publication date Apr 10, 2003
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Application
Voltage testing and measurement
- Publication number 20030057972
- Publication date Mar 27, 2003
- Paul Pfaff
- G01 - MEASURING TESTING

Paul L. Pfaff

Person

Patents Grantslast 30 patents

Methods for obtaining and analyzing digital interferometric data fo...

Optical to optical methods enhancing the sensitivity and resolution...

Multiple beam transmission interferometric testing methods for the...

Multiple optical wavelength interferometric testing methods for the...

Methods and processes for optical interferometric or holographic te...

Optically enhanced holographic interferometric testing methods for...

Optical to optical infrared imaging detection system

Methods for optically enhanced holographic interferometric testing...

Holographic condition assessment system for a structure including a...

Interferometric condition assessment system for a microelectronic s...

Method for optically testing semiconductor devices

Condition assessment method for a structure including a semiconduct...

Condition assessment system for a structure including a semiconduct...

Method for optically testing semiconductor devices

Voltage testing and measurement

Non-destructive testing system using a laser beam

Voltage testing and measurement

Voltage testing and measurement

Method for testing a device under test including the interference o...

Patents Applicationslast 30 patents

Optical methods for obtaining digital data to be used in determinin...

ADVANCED 4-DIMENSIONAL SIGNAL AND DEVICE TESTING USING CIRCUIT-STAT...

MULTIPLE BEAM TRANSMISSION INTERFEROMETRIC TESTING METHODS FOR THE...

MULTIPLE BEAM TRANSMISSION INTERFEROMETRIC TESTING METHODS FOR THE...

OPTICAL TO OPTICAL TIME AND SPATIAL RESOLUTION ENHANCEMENTS FOR IMP...

MULTIPLE OPTICAL WAVELENGTH INTERFEROMETRIC TESTING METHODS FOR THE...

METHODS AND PROCESSES FOR OPTICAL INTERFEROMETRIC OR HOLOGRAPHIC TE...

HOLOGRAPHIC CONDITION ASSESSMENT SYSTEM FOR A STRUCTURE INCLUDING A...

OPTICALLY ENHANCED HOLOGRAPHIC INTERFEROMETRIC TESTING METHODS FOR...

METHOD FOR OPTICALLY ENHANCED HOLOGRAHIC INTERFEROMETRIC TESTING FO...

HOLOGRAPHIC CONDITION ASSESSMENT SYSTEM FOR A STRUCTURE INCLUDING A...

CONDITION ASSESSMENT SYSTEM FOR A STRUCTURE INCLUDING A SEMICONDUCT...

METHOD FOR OPTICALLY TESTING SEMICONDUCTOR DEVICES

CONDITION ASSESSMENT METHOD FOR A STRUCTURE INCLUDING A SEMICONDUCT...

CONDITION ASSESSMENT METHOD FOR A STRUCTURE INCLUDING A SEMICONDUCT...

CONDITION ASSESSMENT SYSTEM FOR A STRUCTURE INCLUDING A SEMICONDUCT...

NON-DESTRUCTIVE TESTING SYSTEM

Non-destructive testing system

Voltage testing and measurement

Voltage testing and measurement

Voltage testing and measurement

Voltage testing and measurement