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Paul M. Gerlach
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Beaverton, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
High waveform throughput with a large acquisition memory
Patent number
8,374,811
Issue date
Feb 12, 2013
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for improved measurement speed in test and mea...
Patent number
8,102,396
Issue date
Jan 24, 2012
Tektronix, Inc.
Kenneth P. Dobyns
G01 - MEASURING TESTING
Information
Patent Grant
Waveform compression and display
Patent number
7,834,780
Issue date
Nov 16, 2010
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Self-adjusting hold-off trigger
Patent number
7,723,976
Issue date
May 25, 2010
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for digitized waveform display
Patent number
7,545,377
Issue date
Jun 9, 2009
Tektronix, Inc.
Kenneth P. Dobyns
G01 - MEASURING TESTING
Information
Patent Grant
Characterizing newly acquired waveforms for identification of wavef...
Patent number
7,359,810
Issue date
Apr 15, 2008
Tektronix, Inc.
Peter J. Letts
G01 - MEASURING TESTING
Information
Patent Grant
Inter-demux communication through a point to point interface
Patent number
7,219,174
Issue date
May 15, 2007
Tektronix, Inc.
Paul M. Gerlach
G01 - MEASURING TESTING
Information
Patent Grant
Architecture for improved display performance in a signal acquisiti...
Patent number
7,158,137
Issue date
Jan 2, 2007
Tektronix, Inc.
Kenneth P. Dobyns
G01 - MEASURING TESTING
Information
Patent Grant
Histogram data collector for applying progressively adjusted histog...
Patent number
7,139,426
Issue date
Nov 21, 2006
Tektronix, Inc.
Kevin T. Ivers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Architecture providing increased information display for long acqui...
Patent number
6,847,905
Issue date
Jan 25, 2005
Tektronix, Inc.
Eric P. Etheridge
G01 - MEASURING TESTING
Information
Patent Grant
Method of controlling a sparse vector rasterizer
Patent number
6,384,825
Issue date
May 7, 2002
Tektronix, Inc.
Jeff W. Yost
G01 - MEASURING TESTING
Information
Patent Grant
Multi-function digital persistence decay
Patent number
6,333,732
Issue date
Dec 25, 2001
Tektronix, Inc.
Paul M. Gerlach
G01 - MEASURING TESTING
Information
Patent Grant
Method of controlling brightness and contrast in a raster scan digi...
Patent number
6,249,115
Issue date
Jun 19, 2001
Tektronix, Inc.
Jeff W. Yost
G01 - MEASURING TESTING
Information
Patent Grant
Reacting to unusual waveforms
Patent number
6,188,384
Issue date
Feb 13, 2001
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Detection of unusual waveforms
Patent number
6,163,758
Issue date
Dec 19, 2000
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Sparse vector rasterization
Patent number
6,104,374
Issue date
Aug 15, 2000
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
High Waveform Throughput with a Large Acquisition Memory
Publication number
20110137594
Publication date
Jun 9, 2011
Tektronix, Inc.
Steven K. SULLIVAN
G01 - MEASURING TESTING
Information
Patent Application
SELF-ADJUSTING HOLD-OFF TRIGGER
Publication number
20080030239
Publication date
Feb 7, 2008
Tektronix, Inc.
Steven K. SULLIVAN
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for improved measurement speed in test and mea...
Publication number
20080012861
Publication date
Jan 17, 2008
Kenneth P. Dobyns
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for digitized waveform display
Publication number
20070273694
Publication date
Nov 29, 2007
Kenneth P. Dobyns
G01 - MEASURING TESTING
Information
Patent Application
Waveform compression and display
Publication number
20070217694
Publication date
Sep 20, 2007
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Application
Characterizing newly acquired waveforms for identification of wavef...
Publication number
20060212239
Publication date
Sep 21, 2006
Peter J. Letts
G01 - MEASURING TESTING
Information
Patent Application
Inter-demux communication through a point to point interface
Publication number
20040013176
Publication date
Jan 22, 2004
Paul M. Gerlach
G01 - MEASURING TESTING
Information
Patent Application
Architecture providing increased information display for long acqui...
Publication number
20040008160
Publication date
Jan 15, 2004
Eric P. Etheridge
G01 - MEASURING TESTING
Information
Patent Application
Architecture for improved display performance in a signal acquisiti...
Publication number
20030231187
Publication date
Dec 18, 2003
Kenneth P. Dobyns
G01 - MEASURING TESTING
Information
Patent Application
Histogram data collector for applying progressively adjusted histog...
Publication number
20030152266
Publication date
Aug 14, 2003
Kevin T. Ivers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF CONTROLLING A SPARSE VECTOR RASTERIZER
Publication number
20010022588
Publication date
Sep 20, 2001
JEFF W. YOST
G01 - MEASURING TESTING