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Paul M. Ingram
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Dallas, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Remote identification of non-lambertian materials
Patent number
8,983,797
Issue date
Mar 17, 2015
Raytheon Company
Paul M. Ingram
G01 - MEASURING TESTING
Information
Patent Grant
In-scene determination of aerosol parameters from imagery
Patent number
8,558,884
Issue date
Oct 15, 2013
Raytheon Company
Paul M. Ingram
G01 - MEASURING TESTING
Information
Patent Grant
Remote identification of non-lambertian materials
Patent number
8,532,958
Issue date
Sep 10, 2013
Raytheon Company
Paul M. Ingram
G01 - MEASURING TESTING
Information
Patent Grant
Remote material identification process performance prediction tool
Patent number
8,515,716
Issue date
Aug 20, 2013
Raytheon Company
Paul M. Ingram
G01 - MEASURING TESTING
Information
Patent Grant
Method for autonomous image registration
Patent number
5,581,638
Issue date
Dec 3, 1996
E-Systems, Inc.
Fenton L. Givens
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Process for multispectral/multilook atmospheric estimation
Patent number
5,462,357
Issue date
Oct 31, 1995
E-Systems, Inc.
Paul M. Ingram
G01 - MEASURING TESTING
Information
Patent Grant
Process for multispectral/multilook atmospheric estimation
Patent number
5,324,113
Issue date
Jun 28, 1994
E-Systems, Inc.
Paul M. Ingram
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
REMOTE IDENTIFICATION OF NON-LAMBERTIAN MATERIALS
Publication number
20140012541
Publication date
Jan 9, 2014
Paul M. Ingram
G01 - MEASURING TESTING
Information
Patent Application
REMOTE MATERIAL IDENTIFICATION PROCESS PERFORMANCE PREDICTION TOOL
Publication number
20120035900
Publication date
Feb 9, 2012
Raytheon Company
Paul M. Ingram
G01 - MEASURING TESTING
Information
Patent Application
REMOTE IDENTIFICATION OF NON-LAMBERTIAN MATERIALS
Publication number
20120035884
Publication date
Feb 9, 2012
Raytheon Company
Paul M. Ingram
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Sensitivity of iterative spectrally smooth temperature/emissivity s...
Publication number
20020035454
Publication date
Mar 21, 2002
Raytheon Company
Paul M. Ingram
G01 - MEASURING TESTING