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Paul Murphy
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Rochester, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated wavefront sensor and profilometer
Patent number
9,097,612
Issue date
Aug 4, 2015
QED Technologies International, Inc.
Andrew Kulawiec
G01 - MEASURING TESTING
Information
Patent Grant
Stitching of near-nulled subaperture measurements
Patent number
8,203,719
Issue date
Jun 19, 2012
QED Technologies International, Inc.
Paul Murphy
G01 - MEASURING TESTING
Information
Patent Grant
Method for accurate high-resolution measurements of aspheric surfaces
Patent number
7,433,057
Issue date
Oct 7, 2008
QED Technologies International, Inc.
Paul E. Murphy
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating the geometry of a multi-axis metrology system
Patent number
7,173,691
Issue date
Feb 6, 2007
QED Technologies International, Inc.
Paul Murphy
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for self-calibrated sub-aperture stitching for surface figur...
Patent number
6,956,657
Issue date
Oct 18, 2005
QED Technologies, Inc.
Donald Golini
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED WAVEFRONT SENSOR AND PROFILOMETER
Publication number
20140152999
Publication date
Jun 5, 2014
Andrew KULAWIEC
G01 - MEASURING TESTING
Information
Patent Application
Stitching of near-nulled subaperture measurements
Publication number
20090251702
Publication date
Oct 8, 2009
OED Technologies International, Inc.
Paul Murphy
G01 - MEASURING TESTING
Information
Patent Application
Method for accurate high-resolution measurements of aspheric surfaces
Publication number
20060221350
Publication date
Oct 5, 2006
QED Technologies, Inc.
Paul E. Murphy
G01 - MEASURING TESTING
Information
Patent Application
Method for calibrating the geometry of a multi-axis metrology system
Publication number
20050134851
Publication date
Jun 23, 2005
QED Technologies, Inc.
Paul Murphy
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Method for self-calibrated sub-aperture stitching for surface figur...
Publication number
20030117632
Publication date
Jun 26, 2003
QED Technologies Inc.
Donald Golini
G01 - MEASURING TESTING