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Paul P. Woskov
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Bedford, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Passive millimeter wave radiometer system for calibration of infrar...
Patent number
10,876,898
Issue date
Dec 29, 2020
National Technology & Engineering Solutions of Sandia, LLC
Ryan D. Murphy
G01 - MEASURING TESTING
Information
Patent Grant
Microwave plasma apparatus and method for materials processing
Patent number
9,932,673
Issue date
Apr 3, 2018
Amastan Technologies LLC
Eric Jordan
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Microwave plasma apparatus and method for materials processing
Patent number
8,748,785
Issue date
Jun 10, 2014
Amastan LLC
Eric Jordan
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Directed energy melter
Patent number
8,525,085
Issue date
Sep 3, 2013
Massachusetts Institute of Technology
Paul Woskov
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Millimeter-wave drilling system
Patent number
8,393,410
Issue date
Mar 12, 2013
Massachusetts Institute of Technology
Paul P. Woskov
E21 - EARTH DRILLING MINING
Information
Patent Grant
Milliwave melter monitoring system
Patent number
7,997,121
Issue date
Aug 16, 2011
Savannah River Nuclear Solutions, LLC
William E. Daniel
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid plasma element monitor
Patent number
7,453,566
Issue date
Nov 18, 2008
Massachusetts Institute of Technology
Kamal Hadidi
G01 - MEASURING TESTING
Information
Patent Grant
Gas processing for waste treatment unit having combined joule and a...
Patent number
7,425,248
Issue date
Sep 16, 2008
Integrated Environmental Technologies, LLC
Paul Woskov
C10 - PETROLEUM, GAS OR COKE INDUSTRIES TECHNICAL GASES CONTAINING CARBON MON...
Information
Patent Grant
Spectroscopic detection
Patent number
6,509,968
Issue date
Jan 21, 2003
Massaschusetts Institute of Technology
Paul P. Woskov
G01 - MEASURING TESTING
Information
Patent Grant
Very high power microwave-induced plasma
Patent number
6,362,449
Issue date
Mar 26, 2002
Massachusetts Institute of Technology
Kamal Hadidi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and apparatus for thickness measurement using microwaves
Patent number
6,198,293
Issue date
Mar 6, 2001
Massachusetts Institute of Technology
Paul Woskov
G01 - MEASURING TESTING
Information
Patent Grant
Compact trace element sensor which utilizes microwave generated pla...
Patent number
6,081,329
Issue date
Jun 27, 2000
Daniel R. Cohn
G01 - MEASURING TESTING
Information
Patent Grant
Microwave plasma element sensor
Patent number
5,909,277
Issue date
Jun 1, 1999
Massachusetts Institute of Technology
Paul Woskov
G01 - MEASURING TESTING
Information
Patent Grant
Compact trace element sensor which utilizes microwave generated pla...
Patent number
5,825,485
Issue date
Oct 20, 1998
Daniel R. Cohn
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibrated active pyrometer for furnace temperature measurements
Patent number
5,785,426
Issue date
Jul 28, 1998
Massachusetts Institute of Technology
Paul P. Woskov
G01 - MEASURING TESTING
Information
Patent Grant
Microwave plasma monitoring system for the elemental composition an...
Patent number
5,671,045
Issue date
Sep 23, 1997
Masachusetts Institute of Technology
Paul P. Woskov
G01 - MEASURING TESTING
Information
Patent Grant
Active radiometer for self-calibrated furnace temperature measurements
Patent number
5,573,339
Issue date
Nov 12, 1996
Electro-Pyrolysis, Inc.
Paul P. Woskov
G01 - MEASURING TESTING
Information
Patent Grant
Continuous, real time microwave plasma element sensor
Patent number
5,479,254
Issue date
Dec 26, 1995
Paul P. Woskov
G01 - MEASURING TESTING
Information
Patent Grant
Microwave/far infrared cavities and waveguides using high temperatu...
Patent number
5,231,073
Issue date
Jul 27, 1993
Massachusetts Institute of Technology
Daniel R. Cohn
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Open tube resonator test setup for conductivity measurements
Patent number
4,968,945
Issue date
Nov 6, 1990
Massachusetts Institute of Technology
Paul P. Woskov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microwave/far infrared cavities and waveguides using high temperatu...
Patent number
4,918,049
Issue date
Apr 17, 1990
Massachusetts Institute of Technology
Daniel R. Cohn
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
PASSIVE MILLIMETER WAVE RADIOMETER SYSTEM FOR CALIBRATION OF INFRAR...
Publication number
20200049562
Publication date
Feb 13, 2020
National Technology & Engineering Solutions of Solutions of Sandia, LLC
Ryan D. Murphy
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
MICROWAVE PLASMA APPARATUS AND METHOD FOR MATERIALS PROCESSING
Publication number
20140287162
Publication date
Sep 25, 2014
Eric Jordan
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Directed Energy Melter
Publication number
20110155720
Publication date
Jun 30, 2011
Paul P. Woskov
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
MILLIMETER-WAVE DRILLING AND FRACTURING SYSTEM
Publication number
20100252324
Publication date
Oct 7, 2010
Massachusetts Institute of Technology
Paul P. Woskov
E21 - EARTH DRILLING MINING
Information
Patent Application
Milliwave melter monitoring system
Publication number
20100008395
Publication date
Jan 14, 2010
William E. Daniel
G01 - MEASURING TESTING
Information
Patent Application
MICROWAVE PLASMA APPARATUS AND METHOD FOR MATERIALS PROCESSING
Publication number
20080173641
Publication date
Jul 24, 2008
Kamal Hadidi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Hybrid plasma element monitor
Publication number
20080055594
Publication date
Mar 6, 2008
Kamal Hadidi
G01 - MEASURING TESTING