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Paul R. Unruh
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Tucson, AZ, US
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last 30 patents
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Patent Grant
Automated minimization of optical path difference and reference mir...
Patent number
6,552,806
Issue date
Apr 22, 2003
Veeco Instruments Inc.
Richard W. Swinford
G01 - MEASURING TESTING
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Patent Grant
Variable-speed scanning for interferometric measurements
Patent number
5,726,754
Issue date
Mar 10, 1998
Wyko Corporation
Michael P. Andrews
G01 - MEASURING TESTING