Paul Ryan

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Darlington, GB

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Patents Grantslast 30 patents

Information Patent Grant
Transmission X-ray critical dimension (T-XCD) characterization of s...
- Patent number 11,761,913
- Issue date Sep 19, 2023
- BRUKER TECHNOLOGIES LTD.
- Adam Ginsburg
- G01 - MEASURING TESTING
Information Patent Grant
Using multiple sources/detectors for high-throughput X-ray topograp...
- Patent number 9,726,624
- Issue date Aug 8, 2017
- BRUKER JV ISRAEL LTD.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam conditioning
- Patent number 9,269,468
- Issue date Feb 23, 2016
- Jordan Valley Semiconductors Ltd.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Grant
Detection of wafer-edge defects
- Patent number 8,781,070
- Issue date Jul 15, 2014
- Jordan Valley Semiconductors Ltd.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
Fast measurement of X-ray diffraction from tilted layers
- Patent number 8,437,450
- Issue date May 7, 2013
- Jordan Valley Semiconductors Ltd.
- John Wall
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Transmission X-Ray Critical Dimension (T-XCD) Characterization of S...
- Publication number 20210341397
- Publication date Nov 4, 2021
- BRUKER TECHNOLOGIES LTD.
- Adam Ginsburg
- G01 - MEASURING TESTING
Information Patent Application
USING MULTIPLE SOURCES/DETECTORS FOR HIGH-THROUGHPUT X-RAY TOPOGRAP...
- Publication number 20150369761
- Publication date Dec 24, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BEAM CONDITIONING
- Publication number 20130287178
- Publication date Oct 31, 2013
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Application
Detection of Wafer-Edge Defects
- Publication number 20130039471
- Publication date Feb 14, 2013
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS
- Publication number 20120140889
- Publication date Jun 7, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- John Wall
- G01 - MEASURING TESTING