Paul S. Zuchowski

Person

Jerico, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reverse performance binning
- Patent number 9,372,520
- Issue date Jun 21, 2016
- GLOBALFOUNDRIES Inc.
- Mark W. Kuemerle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identifying and mitigating electromigration failures in signal nets...
- Patent number 9,104,832
- Issue date Aug 11, 2015
- International Business Machines Corporation
- John E. Barwin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for selectively adding timing margin in an integr...
- Patent number 8,589,843
- Issue date Nov 19, 2013
- International Business Machines Corporation
- David E. Lackey
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for selectively adding timing margin in an integr...
- Patent number 8,504,971
- Issue date Aug 6, 2013
- International Business Machines Corporation
- David E. Lackey
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for selectively adding timing margin in an integr...
- Patent number 8,490,045
- Issue date Jul 16, 2013
- International Business Machines Corporation
- David E. Lackey
- G01 - MEASURING TESTING
Information Patent Grant
On-demand power supply current modification system and method for a...
- Patent number 8,122,165
- Issue date Feb 21, 2012
- International Business Machines Corporation
- Corey K. Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for selectively adding timing margin in an integr...
- Patent number 8,122,409
- Issue date Feb 21, 2012
- International Business Machines Corporation
- David E. Lackey
- G01 - MEASURING TESTING
Information Patent Grant
Structure for an on-demand power supply current modification system...
- Patent number 8,020,137
- Issue date Sep 13, 2011
- International Business Machines Corporation
- Corey K. Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure for system for extending the useful life of another system
- Patent number 8,010,813
- Issue date Aug 30, 2011
- International Business Machines Corporation
- Kenneth J. Goodnow
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for manufacturing diamond shaped chips
- Patent number 7,961,932
- Issue date Jun 14, 2011
- International Business Machines Corporation
- Robert J. Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for system architectures for and methods of scheduling on...
- Patent number 7,949,978
- Issue date May 24, 2011
- International Business Machines Corporation
- Corey K. Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mechanism for detection and compensation of NBTI induced threshold...
- Patent number 7,849,426
- Issue date Dec 7, 2010
- International Business Machines Corporation
- Kenneth J. Goodnow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for extending the useful life of another system
- Patent number 7,793,163
- Issue date Sep 7, 2010
- International Business Machines Corporation
- Kenneth J. Goodnow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for increasing the manufacturing yield of programmable logic...
- Patent number 7,793,251
- Issue date Sep 7, 2010
- International Business Machines Corporation
- Kenneth J. Goodnow
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit testing methods using well bias modification
- Patent number 7,759,960
- Issue date Jul 20, 2010
- International Business Machines Corporation
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Methods and circuits to reduce threshold voltage tolerance and skew...
- Patent number 7,696,811
- Issue date Apr 13, 2010
- International Business Machines Corporation
- Corey Kenneth Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods to reduce threshold voltage tolerance and skew in multi-thr...
- Patent number 7,671,666
- Issue date Mar 2, 2010
- International Business Machines Corporation
- Corey Kenneth Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC tiling pattern method, IC so formed and analysis method
- Patent number 7,669,159
- Issue date Feb 23, 2010
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of providing error detection and correction capab...
- Patent number 7,644,327
- Issue date Jan 5, 2010
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit testing methods using well bias modification
- Patent number 7,564,256
- Issue date Jul 21, 2009
- International Business Machines Company
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
System architectures for and methods of scheduling on-chip and acro...
- Patent number 7,545,165
- Issue date Jun 9, 2009
- International Business Machines Corporation
- Corey K. Barrows
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit testing method using well bias modification
- Patent number 7,486,098
- Issue date Feb 3, 2009
- International Business Machines Corporation
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Circuits to reduce threshold voltage tolerance and skew in multi-th...
- Patent number 7,459,958
- Issue date Dec 2, 2008
- International Business Machines Corporation
- Corey Kenneth Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for extending the useful life of another system
- Patent number 7,437,620
- Issue date Oct 14, 2008
- International Business Machines Corporation
- Kenneth J. Goodnow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing using independently controllable voltage islands
- Patent number 7,428,675
- Issue date Sep 23, 2008
- International Business Machines Corporation
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing methods using well bias modification
- Patent number 7,400,162
- Issue date Jul 15, 2008
- International Business Machines Corporation
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
System and method of providing error detection and correction capab...
- Patent number 7,373,567
- Issue date May 13, 2008
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for manufacturing diamond shaped chips
- Patent number 7,289,659
- Issue date Oct 30, 2007
- International Business Machines Corporation
- Robert J. Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nested voltage island architecture
- Patent number 7,131,074
- Issue date Oct 31, 2006
- International Business Machines Corporation
- Thomas R Bednar
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiple supply gate array backfill structure
- Patent number 7,095,063
- Issue date Aug 22, 2006
- International Business Machines Corporation
- John M. Cohn
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IDENTIFYING AND MITIGATING ELECTROMIGRATION FAILURES IN SIGNAL NETS...
- Publication number 20150205906
- Publication date Jul 23, 2015
- International Buiness Machines Corporation
- John E. Barwin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REVERSE PERFORMANCE BINNING
- Publication number 20150046739
- Publication date Feb 12, 2015
- International Business Machines Corporation
- Mark W. Kuemerle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR SELECTIVELY ADDING TIMING MARGIN IN AN INTEGR...
- Publication number 20120124538
- Publication date May 17, 2012
- International Business Machines Corporation
- David E. LACKEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR SELECTIVELY ADDING TIMING MARGIN IN AN INTEGR...
- Publication number 20120115256
- Publication date May 10, 2012
- International Business Machines Corporation
- David E. LACKEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR SELECTIVELY ADDING TIMING MARGIN IN AN INTEGR...
- Publication number 20120112341
- Publication date May 10, 2012
- International Business Machines Corporation
- David E. LACKEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INCREASING THE MANUFACTURING YIELD OF PROGRAMMABLE LOGIC...
- Publication number 20100333058
- Publication date Dec 30, 2010
- International Business Machines Corporation
- Kenneth J. Goodnow
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Design Structure for an On-Demand Power Supply Current Modification...
- Publication number 20090152591
- Publication date Jun 18, 2009
- International Business Machines Corporation
- Corey K. Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
On-Demand Power Supply Current Modification System and Method for a...
- Publication number 20090152594
- Publication date Jun 18, 2009
- Corey K. Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR EXTENDING THE USEFUL LIFE OF ANOTHER SYSTEM
- Publication number 20090150726
- Publication date Jun 11, 2009
- International Business Machines Corporation
- Kenneth J. Goodnow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Structure for System Architectures for and Methods of Scheduling On...
- Publication number 20090119625
- Publication date May 7, 2009
- International Business Machines Corporation
- Corey K. Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MECHANISM FOR DETECTION AND COMPENSATION OF NBTI INDUCED THRESHOLD...
- Publication number 20090113358
- Publication date Apr 30, 2009
- Kenneth J. Goodnow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR SELECTIVELY ADDING TIMING MARGIN IN AN INTEGR...
- Publication number 20090094565
- Publication date Apr 9, 2009
- David E. Lackey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Testing Using Independently Controllable Voltage Islands
- Publication number 20080284459
- Publication date Nov 20, 2008
- International Business Machines Corporation
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
METHODS TO REDUCE THRESHOLD VOLTAGE TOLERANCE AND SKEW IN MULTI-THR...
- Publication number 20080265983
- Publication date Oct 30, 2008
- Corey Kenneth Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND CIRCUITS TO REDUCE THRESHOLD VOLTAGE TOLERANCE AND SKEW...
- Publication number 20080246533
- Publication date Oct 9, 2008
- Corey Kenneth Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION
- Publication number 20080211531
- Publication date Sep 4, 2008
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION
- Publication number 20080211530
- Publication date Sep 4, 2008
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
System Architectures for and Methods of Scheduling On-Chip and Acro...
- Publication number 20080164903
- Publication date Jul 10, 2008
- International Business Machines Corporation
- Corey K. Barrows
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Design Structure for System for Extending the useful Life of Anothe...
- Publication number 20080168284
- Publication date Jul 10, 2008
- International Business Machines Corporation
- Kenneth J. Goodnow
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM AND METHOD OF PROVIDING ERROR DETECTION AND CORRECTION CAPAB...
- Publication number 20080163016
- Publication date Jul 3, 2008
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods And Circuits To Reduce Threshold Voltage Tolerance and Skew...
- Publication number 20080122524
- Publication date May 29, 2008
- Corey Kenneth Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND CIRCUITS TO REDUCE THRESHOLD VOLTAGE TOLERANCE AND SKEW...
- Publication number 20080086706
- Publication date Apr 10, 2008
- Corey Kenneth Barrows
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION
- Publication number 20080036486
- Publication date Feb 14, 2008
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MANUFACTURING DIAMOND SHAPED CHIPS
- Publication number 20080018872
- Publication date Jan 24, 2008
- IBM
- Robert J. Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR EXTENDING THE USEFUL LIFE OF ANOTHER SYSTEM
- Publication number 20070168759
- Publication date Jul 19, 2007
- International Business Machines Corporation
- Kenneth J. Goodnow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INCREASING THE MANUFACTURING YIELD OF PROGRAMMABLE LOGIC...
- Publication number 20070162792
- Publication date Jul 12, 2007
- Kenneth J. Goodnow
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Testing using independently controllable voltage islands
- Publication number 20060158222
- Publication date Jul 20, 2006
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit testing methods using well bias modification
- Publication number 20060071653
- Publication date Apr 6, 2006
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
A SYSTEM AND METHOD OF PROVIDING ERROR DETECTION AND CORRECTION CAP...
- Publication number 20050278588
- Publication date Dec 15, 2005
- International Business Machines Corporation
- JOHN M. COHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC TILING PATTERN METHOD, IC SO FORMED AND ANALYSIS METHOD
- Publication number 20050273744
- Publication date Dec 8, 2005
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING

Paul S. Zuchowski

Person

Patents Grantslast 30 patents

Reverse performance binning

Identifying and mitigating electromigration failures in signal nets...

Method and device for selectively adding timing margin in an integr...

Method and device for selectively adding timing margin in an integr...

Method and device for selectively adding timing margin in an integr...

On-demand power supply current modification system and method for a...

Method and device for selectively adding timing margin in an integr...

Structure for an on-demand power supply current modification system...

Structure for system for extending the useful life of another system

Method and apparatus for manufacturing diamond shaped chips

Structure for system architectures for and methods of scheduling on...

Mechanism for detection and compensation of NBTI induced threshold...

Method and system for extending the useful life of another system

Method for increasing the manufacturing yield of programmable logic...

Integrated circuit testing methods using well bias modification

Methods and circuits to reduce threshold voltage tolerance and skew...

Methods to reduce threshold voltage tolerance and skew in multi-thr...

IC tiling pattern method, IC so formed and analysis method

System and method of providing error detection and correction capab...

Integrated circuit testing methods using well bias modification

System architectures for and methods of scheduling on-chip and acro...

Integrated circuit testing method using well bias modification

Circuits to reduce threshold voltage tolerance and skew in multi-th...

Method and system for extending the useful life of another system

Testing using independently controllable voltage islands

Integrated circuit testing methods using well bias modification

System and method of providing error detection and correction capab...

Method and apparatus for manufacturing diamond shaped chips

Nested voltage island architecture

Multiple supply gate array backfill structure

Patents Applicationslast 30 patents

IDENTIFYING AND MITIGATING ELECTROMIGRATION FAILURES IN SIGNAL NETS...

REVERSE PERFORMANCE BINNING

METHOD AND DEVICE FOR SELECTIVELY ADDING TIMING MARGIN IN AN INTEGR...

METHOD AND DEVICE FOR SELECTIVELY ADDING TIMING MARGIN IN AN INTEGR...

METHOD AND DEVICE FOR SELECTIVELY ADDING TIMING MARGIN IN AN INTEGR...

METHOD FOR INCREASING THE MANUFACTURING YIELD OF PROGRAMMABLE LOGIC...

Design Structure for an On-Demand Power Supply Current Modification...

On-Demand Power Supply Current Modification System and Method for a...

METHOD AND SYSTEM FOR EXTENDING THE USEFUL LIFE OF ANOTHER SYSTEM

Structure for System Architectures for and Methods of Scheduling On...

MECHANISM FOR DETECTION AND COMPENSATION OF NBTI INDUCED THRESHOLD...

METHOD AND DEVICE FOR SELECTIVELY ADDING TIMING MARGIN IN AN INTEGR...

Testing Using Independently Controllable Voltage Islands

METHODS TO REDUCE THRESHOLD VOLTAGE TOLERANCE AND SKEW IN MULTI-THR...

METHODS AND CIRCUITS TO REDUCE THRESHOLD VOLTAGE TOLERANCE AND SKEW...

INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION

INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION

System Architectures for and Methods of Scheduling On-Chip and Acro...

Design Structure for System for Extending the useful Life of Anothe...

SYSTEM AND METHOD OF PROVIDING ERROR DETECTION AND CORRECTION CAPAB...

Methods And Circuits To Reduce Threshold Voltage Tolerance and Skew...

METHODS AND CIRCUITS TO REDUCE THRESHOLD VOLTAGE TOLERANCE AND SKEW...

INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION

METHOD AND APPARATUS FOR MANUFACTURING DIAMOND SHAPED CHIPS

METHOD AND SYSTEM FOR EXTENDING THE USEFUL LIFE OF ANOTHER SYSTEM

METHOD FOR INCREASING THE MANUFACTURING YIELD OF PROGRAMMABLE LOGIC...

Testing using independently controllable voltage islands

Integrated circuit testing methods using well bias modification

A SYSTEM AND METHOD OF PROVIDING ERROR DETECTION AND CORRECTION CAP...

IC TILING PATTERN METHOD, IC SO FORMED AND ANALYSIS METHOD