Paul Schroeder

Follow

Person

Dresden-Langerbrueck, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining photoresist pattern linearity
- Patent number 6,579,650
- Issue date Jun 17, 2003
- Infineon Technologies AG
- Tobias Mono
- G01 - MEASURING TESTING
Information Patent Grant
Self-aligned STI process using nitride hard mask
- Patent number 6,551,874
- Issue date Apr 22, 2003
- Infineon Technologies, AG
- John Pohl
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for aerial image improvement in projection lit...
- Publication number 20040207827
- Publication date Oct 21, 2004
- Paul Schroeder
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Self-aligned STI process using nitride hard mask
- Publication number 20030045051
- Publication date Mar 6, 2003
- Infineon Technologies North America Corp.
- John Pohl
- H01 - BASIC ELECTRIC ELEMENTS