Paul Silva

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Goleta, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus of tuning a scanning probe microscope
- Patent number 9,116,167
- Issue date Aug 25, 2015
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of tuning a scanning probe microscope
- Patent number 8,997,259
- Issue date Mar 31, 2015
- Bruker Nano, Inc.
- Chanmin Su
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus of Tuning a Scanning Probe Microscope
- Publication number 20160109477
- Publication date Apr 21, 2016
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE
- Publication number 20150204902
- Publication date Jul 23, 2015
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus Of Tuning A Scanning Probe Microscope
- Publication number 20130125269
- Publication date May 16, 2013
- Bruker Nano, Inc.
- Chanmin Su
- B82 - NANO-TECHNOLOGY